Abstract
This study deals with the simplification and the applicability of the van der Pauw method. The convergence analysis of the infinite series of sums that describe the electrical current flow in a rectangular sheet and its closed form based upon q-Pochhammer symbols are presented. Results from finite-element simulations show that the first term of the infinite series of sums is accurate enough for the experimental determination of the electrical resistivity in thin films, semiconductors, and low-dimensional systems.
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs13538-022-01211-7/MediaObjects/13538_2022_1211_Fig1_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs13538-022-01211-7/MediaObjects/13538_2022_1211_Fig2_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs13538-022-01211-7/MediaObjects/13538_2022_1211_Fig3_HTML.png)
Similar content being viewed by others
Data Availability
The data that support the findings of this study are available from the corresponding author upon reasonable request.
References
D.W. Koon, Effect of contact size and placement, and of resistive inhomogeneities on van der Pauw measurements. Rev. Sci. Instrum. 60(2), 271–274 (1989). https://doi.org/10.1063/1.1140422
J. Náhlík, I. Kašpárková, P. Fitl, Study of quantitative influence of sample defects on measurements of resistivity of thin films using van der Pauw method. Meas. J. Int. Meas. Confed. 44(10), 1968–1979 (2011). https://doi.org/10.1016/j.measurement.2011.08.023
K. Szymański, P. Zaleski, Precise measurement of inhomogeneity of 2-D system by six-point method. IEEE Trans. Instrum. Meas. 66(6), 1243–1247 (2017). https://doi.org/10.1109/TIM.2017.2648948
C. Kasl, M.J.R. Hoch, Effects of sample thickness on the van der Pauw technique for resistivity measurements. Rev. Sci. Instrum. 76(3), 1–5 (2005). https://doi.org/10.1063/1.1866232
L.J. van der Pauw, A method of measuring the resistivity and hall coefficient on lamellae of arbitrary shape. Philips Res. Rep. 20, 220–224 (1958)
L.J. van der Pauw, A method of measuring specific resistivity and Hall effect of discs of arbitrary shape. Philips Res. Rep. 13(1), 1–9 (1958)
I. Miccoli, F. Edler, H. Pfnür, C. Tegenkamp, The 100th anniversary of the four-point probe technique: the role of probe geometries in isotropic and anisotropic systems. J. Phys. Condens. Matter. 27(22), (2015). https://doi.org/10.1088/0953-8984/27/22/223201
A.A. Ramadan, R.D. Gould, A. Ashour, On the Van der Pauw method of resistivity measurements. Thin Solid Films. 239(2), 272–275 (1994). https://doi.org/10.1016/0040-6090(94)90863-X
H. Li, Y. Sun, W. Wang, H. Hutchinson, Neurocomputing van der Pauw function for the measurement of a semiconductor’s resistivity without use of the learning rate of weight vector regulation. J. Semicond. 32(12), 1–8 (2011). https://doi.org/10.1088/1674-4926/32/12/122002
J.L. Cieśliński, Modified van der Pauw method based on formulas solvable by the Banach fixed point method. Thin Solid Films. 522, 314–317 (2012). https://doi.org/10.1016/j.tsf.2012.09.018
W.K. Chan, On the calculation of the geometric factor in a van der Pauw sheet resistance measurement. Rev. Sci. Instrum. 71(10), 3964–3965 (2000). https://doi.org/10.1063/1.1290496
S. Hurand, T. Chommaux, P.-O. Renault, T. Girardeau, F. Paumier, Easy and computer-time-saving implementation of the van der Pauw method including anisotropy and probe positioning correction factors using approximate closed-form analytical functions. Rev. Sci. Instrum. 93(5), 053907 (2022). https://doi.org/10.1063/5.0068682
M. Reveil, V.C. Sorg, E.R. Cheng, T. Ezzyat, P. Clancy, M.O. Thompson, Finite element and analytical solutions for van der Pauw and four-point probe correction factors when multiple non-ideal measurement conditions coexist. Rev. Sci. Instrum. 88(9), (2017). https://doi.org/10.1063/1.5001830
C.A.M. dos Santos et al., Procedure for measuring electrical resistivity of anisotropic materials: a revision of the Montgomery method. J. Appl. Phys. 110(80), (2011). https://doi.org/10.1063/1.3652905
J.D. Wasscher, Note on four-point resistivity measurements on anisotropic conductors. Philips Res. Rep. 16, 301–306 (1961)
H.C. Montgomery, Method for measuring electrical resistivity of anisotropic materials. J. Appl. Phys. 42(7), 2971–2975 (1971). https://doi.org/10.1063/1.1660656
F.S. Oliveira, R.B. Cipriano, F.T. da Silva, E.C. Romão, C.A.M. dos Santos, Simple analytical method for determining electrical resistivity and sheet resistance using the van der Pauw procedure. Sci. Rep. 10(1), 1–8 (2020). https://doi.org/10.1038/s41598-020-72097-1
B.F. Logan, S.O. Rice, R.F. Wick, Series for computing current flow in a rectangular block. J. Appl. Phys. 42(7), 2975–2980 (1971). https://doi.org/10.1063/1.1660657
IEEE Computer Society, IEEE standard for binary floating-point arithmetic. ANSI/IEEE Std. 754–1985, 1–20 (1985)
A.P. Prudnikov, Y.A. Brychkov, O.I. Marichev, Integrals and series, vol. 1 (1986)
I.J. Zucker, Some infinite series of exponential and hyperbolic fucntions. SIAM J. Math. Anal. 15(2), 430 (1984). https://doi.org/10.2307/2031953
See for instance the documentation for q-Pochhammer symbols packages available in Wolfram Mathematica: https://reference.wolfram.com/language/ref/QPochhammer.html
F.S. Oliveira, L.G. Guimarães, C.A.M. dos Santos, B.S. de Lima, M.S. da Luz, Electrical and thermodynamic study of SrTiO3 reduction using the van der Pauw method. Mater. Chem. Phys. 263(May), 2021 (2020). https://doi.org/10.1016/j.matchemphys.2021.124428
C. Multiphysics, The COMSOL Multiphysics Reference Manual. Manual, pp. 1–1336, 2015, [Online]. Available: http://www.comsol.com/blogs
R. Chwang, B.J. Smith, C.R. Crowell, Contact size effects on the van der Pauw method for resistivity and Hall coefficient measurement. Solid State Electron. 17(12), 1217–1227 (1974). https://doi.org/10.1016/0038-1101(74)90001-X
S.H.N. Lim, D.R. McKenzie, M.M.M. Bilek, Van der Pauw method for measuring resistivity of a plane sample with distant boundaries. Rev. Sci. Instrum. 80(70), (2009). https://doi.org/10.1063/1.3183503
O. Bierwagen, R. Pomraenke, S. Eilers, W.T. Masselink, Mobility and carrier density in materials with anisotropic conductivity revealed by van der Pauw measurements. Phys. Rev. B - Condens. Matter Mater. Phys. 70(16), 1–6 (2004). https://doi.org/10.1103/PhysRevB.70.165307
O. Bierwagen, Z. Galazka, The inherent transport anisotropy of rutile tin dioxide (SnO2) determined by van der Pauw measurements and its consequences for applications. Appl. Phys. Lett. 112(9), 5 (2018). https://doi.org/10.1063/1.5018983
G. González-Díaz et al., A robust method to determine the contact resistance using the van der Pauw set up. Meas. J. Int. Meas. Confed. 98, 151–158 (2017). https://doi.org/10.1016/j.measurement.2016.11.040
D.K. de Vries, A.D. Wieck, Potential distribution in the van der Pauw technique. Am. J. Phys. 63(12), 1074–1078 (1995). https://doi.org/10.1119/1.18013
Acknowledgements
This work was financed in part by the Fundação de Amparo à Pesquisa do Estado de São Paulo (FAPESP) (No. (2021/03298-7). F.S. Oliveira thanks E. C. Romão for the COMSOL program and C. A. M. dos Santos for the helpful and motivating discussions. The author also thanks the contributions from the reviewer.
Author information
Authors and Affiliations
Corresponding author
Ethics declarations
Conflict of Interest
The author declares no competing interests.
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
About this article
Cite this article
Oliveira, F.S. On the Truncation of Series for the Electrical Current Flow in Rectangular Conducting Sheets. Braz J Phys 52, 206 (2022). https://doi.org/10.1007/s13538-022-01211-7
Received:
Accepted:
Published:
DOI: https://doi.org/10.1007/s13538-022-01211-7