Abstract
The morphology of a thin palladium film deposited on bilayer Al0.35Si0.65O2/Ru(0001), previously proposed as a two-dimensional zeolite model, is investigated using a set of complementary spectroscopy and microscopy tools. Pd single atoms are known to penetrate the bilayer silica, but when a thick Pd film is deposited on the aluminosilicate case some of the metal remains on top of the bilayer oxide. Annealing this surface results in a decrease in the Pd/Si ratio seen in X-ray photoelectron spectroscopy, indicating either further permeation of Pd, or dewetting of surface Pd to form nanoparticles and leave aluminosilicate exposed. An interesting observation is that two very distinct morphologies are obtained for the film. On small narrow terraces, flat wetting films are produced, while on larger terraces Pd particles leaving a partially exposed bilayer aluminosilicate framework are obtained.
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Acknowledgements
This research used resources of the Center for Functional Nanomaterials and the IOS, and ESM beamlines at the National Synchrotron Light Source II, which are U.S. DOE Office of Science User Facilities, at Brookhaven National Laboratory under Contract No. DE-SC0012704. J.Q. Zhong was supported by BNL LDRD Project No. 15-010. This work was supported as part of the Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Basic Energy Sciences under award #DE-SC0012573. We thank Dr. Zhongwei Dai for useful discussions.
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Akter, N., Sadowski, J.T., Zhou, C. et al. Morphology of Palladium Thin Film Deposited on a Two-Dimensional Bilayer Aluminosilicate. Top Catal 62, 1067–1075 (2019). https://doi.org/10.1007/s11244-019-01193-y
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DOI: https://doi.org/10.1007/s11244-019-01193-y