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Crystallization temperature dependence of phase evolution and energy storage feature of KSr2Nb5O15 based glass ceramics

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Abstract

Dense niobate glass ceramics with a principal crystalline phase of KSr2Nb5O15 were obtained via melt-quenching and controlled crystallization technique. The research results reveal that with the crystallization temperature increasing from 800 to 950 °C, the dielectric constant and crystal phase content raise simultaneously. The achieved recoverable energy density (Wrec) displays a continuous increase from 0.61 to 1.23 J/cm3 (@500 kV/cm) with the increment of crystallization temperature from 800 to 950 °C. The glass ceramic obtained at 850 °C exhibits the supreme discharge energy density of 1.82 J/cm3 (@ 700 kV/cm), power density of 192.8 MW/cm3 and energy efficiency of 82%. These findings show that the acquired glass ceramics have potential applications in energy storage fields.

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Our datasets of the paper are available from the corresponding author on reasonable request.

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Funding

This research was supported by Guangxi Science & Technology Planning Project (Grant No. AD21220138), National Natural Science Foundation of China (Grant No. 52162001), Project of Guangxi Key Laboratory of Information Materials (Grant No. 211009-Z).

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Authors and Affiliations

  1. Guangxi Key Laboratory of Information Materials, School of Material Science and Engineering, Guilin University of Electronic Technology, Guilin, 541004, People’s Republic of China

    **le Geng, Yi Wang, Fei Shang & Guohua Chen

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  1. **le Geng
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  2. Yi Wang
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  3. Fei Shang
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  4. Guohua Chen
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Contributions

XG performed the fabrication of glass ceramics and carried out the performance testing. YW performed the dielectric, ferroelectric testing. FS and GC presented the concept and provided resources, and revised the manuscript.

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Correspondence to Fei Shang or Guohua Chen.

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Geng, X., Wang, Y., Shang, F. et al. Crystallization temperature dependence of phase evolution and energy storage feature of KSr2Nb5O15 based glass ceramics. J Mater Sci: Mater Electron 34, 1264 (2023). https://doi.org/10.1007/s10854-023-10686-2

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