Log in

Effect of introducing high temperature gradients on IMC growth and shear properties in hourglass-shaped microbump joints during thermocompression bonding

  • Published:
Journal of Materials Science: Materials in Electronics Aims and scope Submit manuscript

Abstract

Hourglass-shaped microbump joints are expected to be used in three-dimensional (3D) chip stacking interconnect technology due to their strong resistance to electromigration and great underfill compatibility. However, the development of hourglass-shaped joints was challenged by their mechanical strength concerns. In this study, hourglass-shaped microbump joints were formed by stretching the microbump joints during the thermocompression bonding (TCB) process. Meanwhile, a high temperature gradient was introduced into the microbump joints to enable rapid diffusion growth of intermetallic compound (IMC) in Sn-3.5Ag solder, which greatly improved the strength of the microbump joints. The full-IMC microbump joint (108.1 MPa) is twice as strong as the non-full-IMC microbump joint (54.6 MPa), and the 40-µm joints showed even higher strength than that of conventional non-full-IMC microbump joints of 100 μm. The shear test revealed that the hourglass-shaped microbump joint fracture location appeared at the waist rather than near the IMC layer. The fracture mode changed from mixed ductile-brittle fracture to brittle fracture after the transition to full-IMC microbump joints.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Price includes VAT (Germany)

Instant access to the full article PDF.

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8
Fig. 9
Fig. 10
Fig. 11
Fig. 12
Fig. 13
Fig. 14

Similar content being viewed by others

Data availability

Data will be made available on reasonable request.

References

  1. X.W. Zhang, Jk. Lin, S. Wickramanayaka, S.B. Zhang, R. Weerasekera, R. Dutta, K.F. Chang, K.J. Chui, H.Y. Li, D.S.W. Ho, L. Ding, G. Katti, S. Bhattacharya, D.L. Kwong, Heterogeneous 2.5D integration on through silicon interposer. Appl. Phys. Rev. 2(2), 021308 (2015)

    Article  Google Scholar 

  2. M.M. Waldrop, The semiconductor industry will soon abandon its, pursuit of moore’s law, now things could get a lot more interesting. Nature 530, 144–147 (2016)

    Article  CAS  Google Scholar 

  3. T. Huang, S.Y. Liu, H.Q. Ling, M. Li, A.M. Hu, L.M. Gao, T. Hang, Growth behavior and morphology of sidewall intermetallic compounds in Cu/Ni/sn-Ag microbumps during multiple reflows. Mater. Lett. 326, 132877 (2022)

    Article  Google Scholar 

  4. C. Tang, Z. Chen, M.A. Fang, X.Y. **ao, G. Chen, W.H. Zhu, Size effects on IMC growth of Cu/Ni/Sn-3.5Ag microbump joints during isothermal aging and prediction of shear strength using ANN. J. Mater. Res. Technol. 18, 1865–1885 (2022)

    Article  CAS  Google Scholar 

  5. C.Y. Khor, M.Z. Abdullah, F.C. Ani, Underfill process for two parallel plates and flip chip packaging. Int. Commun. Heat Mass Transfer. 39, 1205–1212 (2012)

    Article  Google Scholar 

  6. Y.H. Hsiao, K.L. Lin, The formation and conversion of intermetallic compounds in the Cu pillar Sn-Ag micro-bump with ENEPIG Cu substrate under current stressing. J. Mater. Sci.-Mater. Electron. 27, 2201–2205 (2016)

    Article  CAS  Google Scholar 

  7. F.C. Ng, A. Abas, M.Z. Abdullah, Effect of solder bump shapes on underfill flow in flip-chip encapsulation using analytical, numerical and PIV experimental approaches. Microelectron. Reliab. 81, 41–63 (2018)

    Article  Google Scholar 

  8. P. Chen, X.C. Zhao, Y. Wang, Y. Liu, H. Li, Y. Gu, Enhancement of mean-time-to-failure of Sn3.0Ag0.5Cu solder bump joint under current stressing via controlling bump shape. J. Mater. Sci.-Mater. Electron. 26, 1940–1949 (2015)

    Article  CAS  Google Scholar 

  9. P. Chen, X.C. Zhao, Y. Liu, H. Li, Y. Wang, Aging resistance and mechanical properties of Sn3.0Ag0.5Cu solder bump joints with different bump shapes. Rare Met. 40, 225–230 (2021)

    Article  Google Scholar 

  10. M.S. Kim, M.S. Kang, J.H. Bang, C.W. Lee, M.S. Kim, S. Yoo, Interfacial reactions of fine-pitch Cu/Sn-3.5Ag pillar joints on Cu/Zn and Cu/Ni under bump metallurgies. J. Alloys Compd. 616, 394–400 (2014)

    Article  CAS  Google Scholar 

  11. C. Tang, W.H. Zhu, Z. Chen, L.C. Wang, Thermomechanical reliability of a Cu/Sn-3.5Ag solder joint with a ni insertion layer in flip chip bonding for 3D interconnection. J. Mater. Sci.-Mater. Electron. 32, 11893–11909 (2021)

    Article  CAS  Google Scholar 

  12. P. Yao, X.Y. Li, X. Han, L.F. Xu, Shear strength and fracture mechanism for full Cu-Sn IMCs solder joints with different Cu3Sn proportion and joints with conventional interfacial structure in electronic packaging. Solder. Surf. Mount. Technology. 31, 6–19 (2019)

    Article  Google Scholar 

  13. G.L. Yang, X.Y. Li, E.H. Ren, S.S. Li, Morphology evolution and grain orientations of intermetallic compounds during the formation of full Cu3Sn joint. Intermetallics 145, 107555 (2022)

    Article  CAS  Google Scholar 

  14. T.L. Yang, T. Aoki, K. Matsumoto, K. Toriyama, A. Horibe, H. Mori, Y. Orii, J.Y. Wu, C.R. Kao, Full intermetallic joints for chip stacking by using thermal gradient bonding. Acta Mater. 113, 90–97 (2016)

    Article  CAS  Google Scholar 

  15. Y.Q. Lai, N. Zhao, Study on the evolution of interfacial (Cu,Ni)(6)Sn-5 and shear property of (111)Cu/Sn/Ni micro joints under isothermal and TG-bonding. Intermetallics 147, 107614 (2022)

    Article  CAS  Google Scholar 

  16. J.Y. Feng, C.J. Hang, Y.H. Tian, C.X. Wang, B.L. Liu, Effect of electric current on grain orientation and mechanical properties of Cu-Sn intermetallic compounds joints. J. Alloys Compd. 753, 203–211 (2018)

    Article  CAS  Google Scholar 

  17. H. Cao, Y. Zhang, Y. Zhang, J. Han, D. Su, Z. Zhang, Effect of the anisotropic characteristics of β-Sn on current-induced solder evolution. Mater. Design 224, 111339 (2022)

    Article  CAS  Google Scholar 

  18. H.Y. Zhao, J.H. Liu, Z.L. Li, X.G. Song, Y.X. Zhao, H.W. Niu, H. Tian, H.J. Dong, J.C. Feng, A comparative study on the microstructure and Mechanical Properties of Cu6Sn5 and Cu3Sn joints formed by TLP soldering With/Without the assistance of Ultrasonic waves. Metall. Mater. Trans. a-Phys. Metall. Mater. Sci. 49A, 2739–2749 (2018)

    Article  Google Scholar 

  19. X. Han, X.Y. Li, P. Yao, D.L. Chen, Influence of ultrasounds on interfacial microstructures of Cu-Sn solder joints. Solder. Surf. Mount. Technol. 33, 206–214 (2021)

    Article  Google Scholar 

  20. F.Y. Ouyang, W.C. Jhu, T.C. Chang, Thermal-gradient induced abnormal Ni3Sn4 interfacial growth at cold side in Sn2.5Ag alloys for three-dimensional integrated circuits. J. Alloys Compd. 580, 114–119 (2013)

    Article  CAS  Google Scholar 

  21. S. Baek, G.W. Jeong, J.H. Son, M.S. Kim, H.B.R. Lee, J. Kim, Y.H. Ko, Interfacial reactions and mechanical properties of transient liquid-phase bonding joints in Cu/Sn/Ni(P) and Ni/Sn/(OSP)Cu structures for power modules. J. Mater. Sci.-Mater. Electron. 32, 3324–3333 (2021)

    Article  CAS  Google Scholar 

  22. M.G. Fang, C. Tang, Y.M. Chen, J.H. Li, Z. Chen, F.L. Wang, W.H. Zhu, Thermo-compression bonding process characteristics and shape control of Cu-pillar microbump joints by optimizing of solder melting. J. Mater. Sci.-Mater. Electron. 33, 10471–10485 (2022)

    Article  CAS  Google Scholar 

  23. H.T. Lee, M.H. Chen, H.M. Jao, T.L. Liao, Influence of interfacial intermetallic compound on fracture behavior of solder joints. Mater. Sci. Eng. a-Struct. Mater. Prop. Microstruct. Process 358, 134–141 (2003)

    Article  Google Scholar 

  24. H.Y. Chen, C. Chen, Thermomigration of Cu-Sn and Ni-Sn intermetallic compounds during electromigration in Pb-free SnAg solder joints. J. Mater. Res. 26, 983–991 (2011)

    Article  CAS  Google Scholar 

  25. A. Kunwar, H.R. Ma, H.T. Ma, J.H. Sun, N. Zhao, M.L. Huang, On the increase of intermetallic compound’s thickness at the cold side in liquid sn and SnAg solders under thermal gradient. Mater. Lett. 172, 211–215 (2016)

    Article  CAS  Google Scholar 

  26. H.T. Ma, A. Kunwar, J.H. Sun, B.F. Guo, Ma. In situ study on the increase of intermetallic compound thickness at anode of molten tin due to electromigration of copper. Scripta Mater. 107, 88–91 (2015)

    Article  CAS  Google Scholar 

  27. Y.S. Yang, C.J. Yang, F.Y. Ouyang, Interfacial reaction of Ni3Sn4 intermetallic compound in Ni/SnAg solder/Ni system under thermomigration. J. Alloys Compd. 674, 331–340 (2016)

    Article  CAS  Google Scholar 

  28. D.G. Kim, J.W. Kim, J.G. Lee, H. Mori, D.J. Quesnel, S.B. Jung, Solid state interfacial reaction and joint strength of Sn-37Pb solder with Ni-P under bump metallization in flip chip application. J. Alloys Compd. 395, 80–87 (2005)

    Article  CAS  Google Scholar 

  29. T.T. Dele-Afolabi, M.A.A. Hanim, M. Norkhairunnisa, H.M. Yusoff, M.T. Suraya, Investigating the effect of isothermal aging on the morphology and shear strength of Sn-5Sb solder reinforced with carbon nanotubes. J. Alloys Compd. 649, 368–374 (2015)

    Article  CAS  Google Scholar 

  30. X.W. Hu, T. Xu, L.M. Keer, Y.L. Li, X.X. Jiang, Microstructure evolution and shear fracture behavior of aged Sn3Ag0. 5Cu/Cu solder joints. Mater. Sci. Eng. a-Struct. Mater. Prop. Microstruct. Process 673, 167–177 (2016)

    Article  CAS  Google Scholar 

  31. G.Y. Jang, J.W. Lee, J.G. Duh, The nanoindentation characteristics of Cu6Sn5, Cu3Sn, and Ni3Sn4 intermetallic compounds in the solder bump. J. Electron. Mater. 33, 1103–1110 (2004)

    Article  CAS  Google Scholar 

  32. R.R. Chromik, R.P. Vinci, S.L. Allen, M.R. Notis, Nanoindentation measurements on Cu-Sn and Ag-Sn intermetallics formed in Pb-free solder joints. J. Mater. Res. 18, 2251–2261 (2003)

    Article  CAS  Google Scholar 

  33. M. Abtew, G. Selvaduray, Lead-free solders in microelectronics. Mater. Sci. Eng. R-Rep. 27, 95–141 (2000)

    Article  Google Scholar 

  34. Qk. Zhang, J. Tan, Z.F. Zhang, Fracture behaviors and strength of Cu6Sn5 intermetallic compounds by indentation testing. J. Appl. Phys. 110(1), 014502 (2011)

    Article  Google Scholar 

  35. H.C. Cheng, C.F. Yu, W.H. Chen, Strain- and strain-rate-dependent mechanical properties and behaviors of Cu3Sn compound using molecular dynamics simulation. J. Mater. Sci. 47, 3103–3114 (2012)

    Article  CAS  Google Scholar 

  36. X.S. Liu, G.Q. Lu, Effects of solder joint shape and height on thermal fatigue lifetime. IEEE Trans. Compon. Packag. Technol. 26, 455–465 (2003)

    Article  Google Scholar 

Download references

Acknowledgements

This work is supported by National Natural Science Foundation of China (Grant No. U20A6004), Key Project of Science and Technology of Changsha (kq2102005), Natural Science Foundation of Hunan Province (Grant No. 2021JJ40734).

Author information

Authors and Affiliations

Authors

Contributions

CT: data curation, writing - original draft. ZC: methodology, writing-review and editing, supervision. WZ: conceptualization, methodology.

Corresponding authors

Correspondence to Zhuo Chen or Wenhui Zhu.

Ethics declarations

Conflict of interest

The authors declare that they have no known competing financial interests or personal relationships that could have appeared to influence the work reported in this paper.

Additional information

Publisher’s Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Tang, C., Chen, Z. & Zhu, W. Effect of introducing high temperature gradients on IMC growth and shear properties in hourglass-shaped microbump joints during thermocompression bonding. J Mater Sci: Mater Electron 34, 702 (2023). https://doi.org/10.1007/s10854-023-10124-3

Download citation

  • Received:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s10854-023-10124-3

Navigation