Abstract
This paper presents the design and Silicon verification of a 2.488–11.2 Gbps multi-standard SerDes transceiver in a 40 nm low-leakage CMOS process. The paper explores the architectural and circuit techniques used to meet the stringent requirements of the high-speed SerDes and to mitigate the performance impact of the low-leakage process. A system modeling approach is described, which is used for optimizing the architectural trade-offs. The transceiver makes use of a low-jitter LC phase locked loop to enable high-reliability system design. The design has 420 fs RJrms and consumes 30.1 mW/Gbps at 11.2 Gbps.
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The authors would like to acknowledge the support of the lab teams from MoSys and **linx for help with the silicon measurements.
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Vamvakos, S.D., Gauthier, C.R., Rao, C. et al. A 2.488–11.2 Gb/s SerDes in 40 nm low-leakage CMOS with multi-protocol compatibility for FPGA applications. Analog Integr Circ Sig Process 78, 259–273 (2014). https://doi.org/10.1007/s10470-013-0172-1
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DOI: https://doi.org/10.1007/s10470-013-0172-1