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Investigating the nanostructured gold thin films using the multifractal analysis

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Abstract

The atomic force microscopy images representing the surface morphology of the nanostructured gold thin films of thickness of 20, 50 and 200 nm, respectively, were investigated using the multifractal analysis. The interface width and growth exponent corresponding to films of different thicknesses were estimated. The surfaces having greater roughness give rise to larger nonlinearity and wider width of the multifractal spectrum. The statistical tests confirm that the gold thin film surfaces under investigation are multifractal in nature.

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Acknowledgments

RPY is thankful to the CSIR-UGC for providing financial support in the form of senior research fellowship.

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Authors and Affiliations

  1. Department of Physics, University of Allahabad, Allahabad, 211002, UP, India

    R. P. Yadav & A. K. Mittal

  2. Inter-University Accelerator Centre, Aruna Asaf Ali Marg, P. O. Box 10502, New Delhi, 110 067, India

    U. B. Singh

  3. K Banerjee Centre of Atmospheric and Ocean Studies, University of Allahabad, Allahabad, 211002, UP, India

    A. K. Mittal & S. Dwivedi

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  1. R. P. Yadav
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Correspondence to S. Dwivedi.

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Yadav, R.P., Singh, U.B., Mittal, A.K. et al. Investigating the nanostructured gold thin films using the multifractal analysis. Appl. Phys. A 117, 2159–2166 (2014). https://doi.org/10.1007/s00339-014-8636-4

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