Abstract.
The research work in this letter is on the microtribological properties of poly(ether ketone ketone) (PEKK) and sulfonated PEKK (S-PEKK) thin films. Polystyrene (PS) was used as a reference for the investigation. Atomic-force-microscopy (AFM) techniques were used for observing the topography and friction properties of the macromolecular thin films at the nanometer scale. The polymeric thin films were fabricated by spin coating at a speed of 4000 rotations per minute (rpm).
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Received: 18 February 2002 / Accepted: 30 May 2002 / Published online: 10 September 2002
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ID="*"Corresponding author. Fax: +49-6421/282-5785, E-mail: chen@chemie.uni-marburg.de Present address: Philipps Universität-Marburg, FB Chemie, Institut für Makromolekulare Chemie, Hans-Meerwein Strasse, 35032 Marburg, Germany
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Chen, Y., Gan, D., Kreiling, S. et al. Topography and friction properties of macromolecular thin films using atomic-force-microscopy technology . Appl Phys A 76, 129–132 (2003). https://doi.org/10.1007/s00339-002-1504-7
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DOI: https://doi.org/10.1007/s00339-002-1504-7