Abstract
Based on a simple theoretical background, numerous applications of the16O(α, α)16O reaction are reviewed. The reaction lowers the detection limit of the conventional RBS by a factor of 17. The advantages of the method for several applications will be discussed.
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G. Amsel, J. P. Nadai, E. D. Artemare, D. David and J. Moulin, Nucl. Instr. Meth.,92, 481, 1971.
S. T. Picraux, G. Amsel and L. C. Feldman, Ion Beam Handbook for Material Analysis, Eds. J. W. Mayer and E. Rimini, Academic Press, New York, 1977.
O. Meyer, J. Gyulai and J. W. Mayer, Surf. Sci.,22, 263, 1970.
W. K. Chu, E. Lugujjo, J. W. Mayer and T. W. Sigmon, Thin Solid Films,19, 329, 1973.
G. Dearnaley, P. D. Goode, W. S. Miller and J. F. Turner, Ion Implantation in Semiconductors and Other Materials, Ed. B. L. Crowder, Plenum Press, New York, 1973, p. 405.
G. Dearnaley, J. M. Freeman, R. S. Nelson and J. Stephen, Ion Implantation, North Holland, Amsterdam, 1973, p. 734.
J. Cameron, Phys. Rev.,90, 839, 1953.
L. Keszthelyi, I. Demeter, G. Mezey, Z. Szőkefalvi-Nagy and L. Varga, Proc. Int. Meeting on Ion Implantation in Semiconductors, Rossendorf, GDR, ZfK-236, 1972, p. 111.
W. K. Chu, J. W. Mayer, M-A. Nicolet, G. Amsel, T. Buck and F. Eisen, Thin Solid Films,17, 1, 1973.
G. Mezey, J. Gyulai, T. Nagy, E. Kótai and A. Manuaba, Ion-Beam Surface Layer Analysis, Eds. O. Meyer, G. Linker, F. Käppeler, Plenum Press, New York, 1976, p. 303.
G. Mezey, T. Nagy, J. Gyulai, E. Kótai, T. Lohner and M. Somogyi, Thin Solid Films,43, L23, 1977.
G. Mezey, T. Nagy, J. Gyulai, E. Kótai, T. Lohner, M. Somogyi and C. A. Evans, Proc. 7th International Vac. Congr. and 3rd Int. Conf. on Solid Surfaces, Vienna, 1977 p. 571.
M. Somogyi, M. Farkas, G. Mezey and J. Gyulai, Thin Solid Films,60, 377, 1979.
G. Mezey, E. Kótai, T. Nagy, L. Lohner, A. Manuaba, J. Gyulai, V. R. Deline, C. A. Evans and R. J. Blattner, Nucl. Instr. Meth.,167, 279, 1979.
G. Battistig, P. Révész, E. Kennedy and J. Gyulai, to be published.
E. Kótai, G. Mezey, T. Lohner, A. Manuaba, F. Pászti and J. Gyulai, Nucl. Instr. Meth,180, 619, 1981.
I. Gyuro, E. Lendvay, T. Görög, T. Lohner, M. Hársy, I. Poszgai, K. Somogyi, J. Gyulai, M. Ránki, L. Varga, R. Koltai, J. Giber, L. Bori, L. L. Regel, N. A. Kulchitskiy and V. T. Khryapov, to be published in Proc. XXXIV Congress of the International Astronautical Federation.
Z. L. Vang, J. F. M. Westendorp and F. W. Saris, Nucl. Instr. Methods,211, 193, 1983.
J. M. Poate, T. M. Buck and B. Schwartz, J. Chem. Solids,34, 779, 1973.
J. M. Poate, P. J. Silverman and J. Yahalan, J. Electrochem. Soc.,120, 844, 1973.
F. Kukes, Surf. Sci.,30, 91, 1972.
O. Meyer and J. W. Mayer, Rad. Effects,3, 139, 1970.
G. Mezey, T. Nagy, J. Gyulai, E. Kótai, A. Manuaba, T. Lohner and J. W. Mayer, Ion Implantation in Semiconductors, 1976. Eds. F. Chernow, J. A. Borders and D. K. Brice, Plenum Press, New York, 1977, p. 49.
H. Muller, W. K. Chu, J. Gyulai, J. W. Mayer, T. W. Sigmon and T. R. Cass, Appl. Phys. Lett.,26, 292, 1975.
J. S. Williams and W. Möller, Nucl. Instr. Meth.,157, 213, 1978.
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Dedicated to Prof. S. Szalay on his 75th birthday
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Mezey, G., Kótai, E., Révész, P. et al. Enhanced sensitivity of oxygen detection of 3.045 MeV (α, α) elastic scattering and its applications. Acta Physica Hungarica 58, 39–55 (1985). https://doi.org/10.1007/BF03155695
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DOI: https://doi.org/10.1007/BF03155695