Abstract
On the basis of integrated intensity of rocking curves, the multiplicity factor and the diffraction geometry factor for single crystal X-ray diffraction (XRD) analysis were proposed and a general formula for calculating the content of mixed phases was obtained. With a multifunction four-circle X-ray double-crystal diffractometer, pole figures of cubic (002), 1111 and hexagonal 1010 and reciprocal space map** were measured to investigate the distributive character of mixed phases and to obtain their multiplicity factors and diffraction geometry factors. The contents of cubic twins and hexagonal inclusions were calculated by the integrated intensities of rocking curves of cubic (002), cubic twin 111, hexagonal 1010 and 1011.
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Qu, B., Zheng, X., Wang, Y. et al. Multiplicity factor and diffraction geometry factor for single crystal X-ray diffraction analysis and measurement of phase content in cubic GaN/GaAs(001) epilayers. Sci. China Ser. A-Math. 44, 497–503 (2001). https://doi.org/10.1007/BF02881887
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DOI: https://doi.org/10.1007/BF02881887