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The profile of layered materials reflected by glancing-incidence X-ray analysis

  • High-Resolution X-Ray Characterization Of Materials
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Abstract

Specular reflectivity, diffuse scattering at glancing incidence and angle-dependent total-reflection X-ray fluorescence are complementary techniques for the investigation of layered materials. The principles of these glancing-incidence X-ray methods are briefly discussed. Examples show the strength of the combination of these techniques.

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Authors and Affiliations

  1. Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands

    D. K. G. de Boer & A. J. G. Leenaers

  2. Philips Analytical X-Ray b.v., Lelyweg 1, 7602 EA, Almelo, The Netherlands

    W. W. van den Hoogenhof

Authors
  1. D. K. G. de Boer
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  2. A. J. G. Leenaers
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  3. W. W. van den Hoogenhof
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de Boer, D.K.G., Leenaers, A.J.G. & van den Hoogenhof, W.W. The profile of layered materials reflected by glancing-incidence X-ray analysis. Appl. Phys. A 58, 169–172 (1994). https://doi.org/10.1007/BF00324372

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  • DOI: https://doi.org/10.1007/BF00324372

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