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Temperature Dependent Octahedral Tilting Behaviors of Monoclinic and Tetragonal SrRuO3 Thin Films

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Abstract

We used in-situ synchrotron X-ray scattering to investigate phase transformations of octahedral tilted monoclinic SrRuO3 (MSRO) and tetragonal SRO (TSRO) thin films on SrTiO3 (STO) substrates. The octahedral tilted MSRO thin films were highly crystalline and the monoclinic distortion angle was 0.45°. The phase transition temperature from the MSRO to TSRO phase occurred at approximately 200 °C as a second order transition. Conversely, no phase transformations of the TSRO thin film occurred within the range from RT to 250 °C. The octahedral RuO6 rotation was strongly affected by the phase transformation in the SRO thin films.

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Authors and Affiliations

  1. School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju, 61005, Korea

    Sung Su Lee

  2. Synchrotron X-ray Station at SPring-8, Research Network and Facility Services Division, National Institute for Materials Science (NIMS), Kouto, Sayo, Hyogo, 679-5148, Japan

    Okkyun Seo, Jaemyung Kim, Chulho Song, Satoshi Hiroi, Yanna Chen, Yoshio Katsuya & Osami Sakata

  3. Synchrotron X-ray Group, Research Center for Advanced Measurement and Characterization, NIMS, Kouto, Sayo, Hyogo, 679-5148, Japan

    Okkyun Seo, Jaemyung Kim, Chulho Song, Satoshi Hiroi, Yanna Chen, Yoshio Katsuya & Osami Sakata

  4. Department of Innovative and Engineered Materials, Tokyo Institute of Technology, Nagatsuta, Midori, Yokohama, 226-8502, Japan

    Osami Sakata

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  1. Sung Su Lee
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  2. Okkyun Seo
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Correspondence to Okkyun Seo.

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Lee, S.S., Seo, O., Kim, J. et al. Temperature Dependent Octahedral Tilting Behaviors of Monoclinic and Tetragonal SrRuO3 Thin Films. J. Korean Phys. Soc. 73, 1529–1534 (2018). https://doi.org/10.3938/jkps.73.1529

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  • DOI: https://doi.org/10.3938/jkps.73.1529

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