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Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study

  • Proceedings of the Interdisciplinary Symposium “Ordering in Minerals and Alloys” OMA-18 and Proceedings of the International Interdisciplinary Symposium “Order, Disorder, and Properties of Oxides” ODPO-18
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

The electronic structure of SiO2 is investigated by means of valence to core X-ray emission spectroscopy and quantum-mechanical calculations in the density functional theory approximation. Analysis of a complete set of SiK α1, SiL 2, 3, and OK α X-ray emission and XPS spectra along with the calculated data provides comprehensive information on chemical interactions that occur in SiO2.

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Authors and Affiliations

  1. Research Institute of Physics, Southern Federal University, Rostov-on-Don, 344090, Russia

    T. N. Danilenko, M. M. Tatevosyan & V. G. Vlasenko

Authors
  1. T. N. Danilenko
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  2. M. M. Tatevosyan
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  3. V. G. Vlasenko
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Correspondence to T. N. Danilenko.

Additional information

Original Russian Text © T.N. Danilenko, M.M. Tatevosyan, V.G. Vlasenko, 2016, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2016, Vol. 80, No. 6, pp. 809–812.

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Danilenko, T.N., Tatevosyan, M.M. & Vlasenko, V.G. Electronic structure of SiO2: An X-ray emission spectroscopic and density functional theoretical study. Bull. Russ. Acad. Sci. Phys. 80, 738–741 (2016). https://doi.org/10.3103/S1062873816060113

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  • DOI: https://doi.org/10.3103/S1062873816060113

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