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X-ray diffraction methods for diagnostics of surface and nanolayers of crystalline structures (review)

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Abstract

X-ray diffraction methods for investigation of thin surface layers of crystals and characterization of the structures containing nanolayers are considered: double- and triple-crystal diffractometry, asymptotic diffraction, and diffraction under conditions of total external reflection of X-rays. Theoretical foundation of the methods and conditions of their experimental implementation are described and exemplified.

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  1. Shubnikov Institute of Crystallography, Russian Academy of Sciences, Moscow, Russia

    V. V. Lider

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Original Russian Text © V.V. Lider, 2013, published in Zavodskaya Laboratoriya. Diagnostika Materialov, 2013, Vol. 79, No. 8, pp. 24–34.

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Lider, V.V. X-ray diffraction methods for diagnostics of surface and nanolayers of crystalline structures (review). Inorg Mater 50, 1459–1469 (2014). https://doi.org/10.1134/S0020168514150072

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