Abstract
Oxide materials are one of the most advanced key technology in the thin film transistors (TFTs) for the high-end of device applications. Amorphous oxide semiconductors (AOSs) have leading technique for flat panel display, active matrix organic light emitting display, active matrix liquid crystal display as well as thin film electronic devices due to their excellent electrical characteristics, such as field effect mobility (μFE), subthreshold swing (SS) and threshold voltage (Vth). Researchers from various fields have studied and considered ways to improve µFE of AOS TFT, which has been studied for 16 years since 2004. Since 2004, mobility has been increased by using various methods, such as designing novel amorphous oxide materials, changing device structures, or adopting new post-treatment. The development of field effect mobility as well as the stability enhancement has been comprehensively reviewed in this report.
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig1_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig2_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig3_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig4_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig5_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig6_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig7_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig8_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig9_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig10_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig11_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig12_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig13_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig14_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig15_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig16_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig17_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig18_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig19_HTML.jpg)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig20_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig21_HTML.png)
![](http://media.springernature.com/m312/springer-static/image/art%3A10.1007%2Fs42341-020-00197-w/MediaObjects/42341_2020_197_Fig22_HTML.png)
Similar content being viewed by others
References
M.H. Devoret, R.J. Schoelkopf, Science 339, 1169 (2013)
M. Mohseni, P. Read, H. Neven, S. Boixo, V. Denchev, R. Babbush, A. Fowler, V. Smelyanskiy, J. Martinis, Nature 543, 171 (2017)
J. Raja, K. Jang, C.P.T. Nguyen, J. Yi, N. Balaji, S.Q. Hussain, S. Chatterjee, Trans. Electr. Electron. Mater. 16, 234 (2015)
T.G. Lee, S.H. Cho, D.H. Kim, H.G. Hwang, K.T. Lee, C.H. Hong, Y.W. Hong, K.H. Chae, J.W. Choi, J.S. Kim, S. Nahm, J. Eur. Ceram. Soc. 39, 973 (2019)
K. Nomura, H. Ohta, A. Takagi, T. Kamiya, M. Hirano, H. Hosono, Nature 432, 488 (2004)
T. Kamiya, H. Hosono, NPG Asia Mater. 2, 15 (2010)
Q. Wu, J. Wang, J. Cao, C. Lu, G. Yang, X. Shi, X. Chuai, Y. Gong, Y. Su, Y. Zhao, N. Lu, D. Geng, H. Wang, L. Li, M. Liu, Adv. Electron. Mater. 4, 1870058 (2018)
Y. Liu, X. Wang, W. Chen, L. Zhao, W. Cheng, Z. Zhuo, J. Wang, T.L. Ren, J. Xu, Superlattices Microstruct. 128, 177 (2019)
J. Zhang, S. Dai, Y. Zhao, J. Zhang, J. Huang, Adv. Intell. Syst. 1, 1900136 (2019)
J.M. Byun, S.Y. Lee, Trans. Electr. Electron. Mater. 20, 518 (2019)
H. Hosono, M. Yasukawa, H. Kawazoe, J. Non-Cryst. Solids 203, 334 (1996)
T. Kamiya, K. Nomura, H. Hosono, J. Disp. Technol. 5, 462 (2009)
T. Kamiya, K. Nomura, H. Hosono, J. Disp. Technol. 5, 273 (2009)
S. Aikawa, T. Nabatame, K. Tsukagoshi, Appl. Phys. Lett. 103, 172105 (2013)
I.J. Kang, C.H. Park, E. Chong, S.Y. Lee, Curr. Appl. Phys. 12, S12 (2012)
E.M.C. Fortunato, L.M.N. Pereira, P.M.C. Barquinha, A.M.B. do Rego, G. Gonçalves, A. Vilà, J.R. Morante, R.F.P. Martins, Appl. Phys. Lett. 92, 222103 (2008)
M. Ryu, T.S. Kim, K.S. Son, H.S. Kim, J.S. Park, J.B. Seon, S.J. Seo, S.J. Kim, E. Lee, H. Lee, S.H. Jeon, S. Han, S.Y. Lee, 2012 Tech. Dig. Int. Electron. Devices Meet. 12, 112 (2012)
H.S. Kim, S.H. Jeon, J.S. Park, T.S. Kim, K.S. Son, J.B. Seon, S.J. Seo, S.J. Kim, E. Lee, J.G. Chung, Sci. Rep. 3, 1459 (2013)
K.C. Ok, H.J. Jeong, H.S. Kim, J.S. Park, IEEE Electron. Device Lett. 36, 38–40 (2015)
H.J. Jeong, H.M. Lee, K.C. Ok, J. Park, J.S. Park, J. Mater. Chem. C 6, 5171 (2018)
T. Hirao, M. Furuta, T. Hiramatsu, T. Matsuda, C. Li, H. Furuta, H. Hokari, M. Yoshida, H. Ishii, M. Kakegawa, IEEE Trans. Electron. Device 55, 3136 (2008)
S.H. Ryu, Y.C. Park, M. Mativenga, D.H. Kang, J. Jang, ECS Solid State Lett. 1, Q17 (2012)
J.C. Park, S.W. Kim, S.I. Kim, H. Yin, J.H. Hur, S.H. Jeon, S.H. Park, I.H. Song, Y.S. Park, U.I. Chung, M.K. Ryu, S. Lee, S. Kim, Y. Jeon, D.M. Kim, D.H. Kim, K.W. Kwon, C.J. Kim, 2009 Tech. Dig. Int. Electron. Devices Meet. 09, 191 (2009)
X. Deng, Y. Zhang, H. Fu, S. Zhang, in 9th International CAD-TFT, vol 1 (2018), p. 33
J.H. Yang, J.H. Choi, S.H. Cho, J.E. Pi, H.O. Kim, C.S. Hwang, K. Park, S. Yoo, IEEE Electron. Device Lett. 39, 508 (2018)
Y. Goh, T. Kim, J.H. Yang, J.H. Choi, C.S. Hwang, S.H. Cho, S. Jeon, A.C.S. Appl, Mater. Interfaces 9, 9271 (2017)
D. Lin, S. Pi, J. Yang, N. Tiwari, J. Ren, Q. Zhang, P.T. Liu, H.P. Shieh, Semicond. Sci. Technol. 33, 065001 (2018)
A.H. Tai, C.C. Yen, T.L. Chen, C.H. Chou, C.W. Liu, IEEE Trans. Electron. Devices 66, 4188 (2019)
J.C. Park, S. Kim, S. Kim, C. Kim, I. Song, Y. Park, U.I. Jung, D.H. Kim, J.S. Lee, Adv. Mater. 22, 5512 (2010)
B.H. Lee, A. Sohn, S. Kim, S.Y. Lee, Sci. Rep. 9, 886 (2019)
J.Y. Choi, S. Kim, D.H. Kim, S.Y. Lee, Thin Solid Films 594, 293 (2015)
C. Dong, J. Xu, Y. Zhou, Y. Zhang, H. **e, Solid State Electron. 153, 74 (2019)
J.S. Park, J.K. Jeong, Y.G. Mo, H.D. Kim, S.I. Kim, Appl. Phys. Lett. 90, 262106 (2007)
L. Lu, J. Li, Z.Q. Feng, H.S. Kwok, M. Wong, IEEE Electron. Device Lett. 37, 728 (2016)
L.F. Teng, P.T. Liu, Y.J. Lo, Y.J. Lee, Appl. Phys. Lett. 101, 132901 (2012)
Y.J. Chen, M.S. Cao, T.H. Wang, Q. Wan, Appl. Phys. Lett. 84, 3367 (2004)
R.F. Zhuo, L. Qiao, H.T. Feng, J.T. Chen, D. Yan, Z.G. Wu, P.X. Yan, J. Appl. Phys. 104, 094101 (2008)
K.W. Jo, W.J. Cho, Appl. Phys. Lett. 105, 213505 (2014)
Y. Nam, J.H. Yang, P. Jeong, O.S. Kwon, J.E. Pi, H.O. Kim, S.H. Cho, C.S. Hwang, S. Ji, S.H.K. Park, Dig. Technol. Pap. 49, 1249 (2018)
J.G. Troughton, P. Downs, R. Price, D. Atkinson, Appl. Phys. Lett. 110, 11903 (2017)
S. Mukhopadhyay, S. Gowtham, R. Pandey, A. Costales, J. Mol. Struct. THEOCHEM 948, 31 (2010)
K. Nomura, T. Kamiya, H. Hosono, ECS J. Solid State Sci. Technol. 2, P5 (2013)
H.J. Jeong, H.M. Lee, C.H. Ryu, E.J. Park, K.L. Han, H.J. Hwang, K.C. Ok, H.S. Kim, J.S. Park, ACS Appl. Mater. Interfaces 11, 4152 (2019)
M.Y. Tsai, T.C. Chang, A.K. Chu, T.Y. Hsieh, T.C. Chen, K.Y. Lin, W.W. Tsai, W.J. Chiang, J.Y. Yan, Appl. Phys. Lett. 103, 012101 (2013)
M.J. Powell, IEEE 36, 2753 (1989)
A. Takagi, K. Nomura, H. Ohta, H. Yanagi, T. Kamiya, M. Hirano, H. Hosono, Thin Solid Films 486, 38 (2005)
K.W. Lee, H.S. Shin, K.Y. Heo, K.M. Kim, H.J. Kim, J. Inf. Disp 10, 171 (2009)
B. Ryu, H.-K. Noh, E.-A. Choi, K.J. Chang, Appl. Phys. Lett. 97, 022108 (2010)
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher's Note
Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Lee, S.Y. Comprehensive Review on Amorphous Oxide Semiconductor Thin Film Transistor. Trans. Electr. Electron. Mater. 21, 235–248 (2020). https://doi.org/10.1007/s42341-020-00197-w
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s42341-020-00197-w