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On Nirmala Indices-based Entropy Measures of Silicon Carbide Network \(Si_{2}C_{3}-III[\alpha ,\beta ]\)

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Abstract

A numerical parameter, referred to as a topological index, is used for representing the molecular structure of a compound by analyzing its graph-theoretical characteristics. In the context of quantitative structure-activity relationship (QSAR) and quantitative structure-property relationship (QSPR) studies, topological indices serve as predictive tools for the physicochemical properties of chemical compounds. Graph entropies have evolved into information-theoretic instruments for exploring the structural information of molecular graphs. In this research, we compute the Nirmala index, as well as the first and second inverse Nirmala index, for the silicon carbide network \(Si_{2}C_{3}-III[\alpha ,\beta ]\), using its M-polynomial. The comparison of the Nirmala indices and corresponding entropy measures are presented through numerical computation and 2D line plots. A regression model is built to investigate the relationship between the Nirmala indices and corresponding entropy measures.

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Correspondence to H. C Shilpa.

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Shilpa, H.C., Gayathri, K., Dharmendra, B.N. et al. On Nirmala Indices-based Entropy Measures of Silicon Carbide Network \(Si_{2}C_{3}-III[\alpha ,\beta ]\). Silicon (2024). https://doi.org/10.1007/s12633-024-03071-z

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