Abstract
We present a study on the superconducting properties of 500 nm thick NbTiN films grown by reactive co-sputtering on silicon substrates at room temperature. The samples exhibit a chemical composition with Nb (50 at.%) and Ti (50 at.%), revealing a polycrystalline structure characterized by columnar growth and an average lateral grain size of approximately 40 nm. The superconducting critical temperature (Tc) was measured at 13.8 K, and the upper critical field extrapolated to zero temperature reached 22 T, resulting in a coherence length (ξ) of 3.8 nm. The penetration depth (λ) was determined through local magnetic force microscopy measurements conducted at temperatures of 4.25 and 6 K. The obtained values were 400 (15) nm at 4.25 K and 430 (15) nm at 6 K. Extrapolating these measurements to zero temperature, we obtained an estimated value of 380 nm. A comparison was made with samples that underwent thermal annealing at 700 °C, resulting in a reduction of disorder at the nanoscale and an increase in Tc to 14.2 K. Despite this enhancement, the coherence length ξ (0) remained at approximately 3.8 nm, with no appreciable changes in the λ values. Our findings contribute to understanding fundamental superconducting parameters in nitride thin films, with potential applications ranging from resonant accelerator cavities to Josephson junctions and radiation detectors.
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Data availability
The data sets analyzed during the current study are available from the corresponding author on reasonable request.
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Acknowledgements
The authors acknowledge B. Pentke and C. Bertoli for technical assistance. This work was partially supported by ANCYPT 2022-09-00432, U. N. de Cuyo 06/C013T1, CONICET (PIP 11220210100263CO), BrainLink program funded by the Ministry of Science and ICT through the National Research Foundation of Korea (2022H1D3A3A01077468) and Brain Pool program funded by the Ministry of Science and ICT through the National Research Foundation of Korea (RS-2023-00222408). YL, JY and JK were supported by the National Research Foundation of Korea (NRF) grant funded by the Korean government (MSIT) (Grant No. NRF-2019R1A2C2090356) and the Technology Development Program (Grant No. S3198743) funded by the Ministry of SMEs and Startups (MSS, Korea).
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NH grew the samples and performed XRD. YL and NH performed electrical transport measurements. YL, JY, CL and JK performed AFM and MFM measurements and analysis. All the authors contributed equally to the discussion and the writing of the manuscript.
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Lee, Y., Yun, J., Lee, C. et al. Penetration depth in dirty superconducting NbTiN thin films grown at room temperature. Appl. Phys. A 130, 504 (2024). https://doi.org/10.1007/s00339-024-07650-0
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DOI: https://doi.org/10.1007/s00339-024-07650-0