Standardization of Integrated Circuits Packaging

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Handbook of Integrated Circuit Industry
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Abstract

Packaging standards define the requirements of structure, material, surface coating, external checking, and testing of product reliability, etc. This chapter describes the standardization of IC packaging, including the introduction of international packaging standardization organizations, such as International Electro-technical Commission (IEC), Semiconductor Equipment and Materials International (SEMI), Joint Electronic Device Engineering Council (JEDEC) Standards, and Association Connecting Electronics Industries (IPC) Standards. In addition, China packaging standardization organizations, the description of standardization of package outlines and package naming, National Standard for Integrated Circuit Packaging (GJB), US Military (MIL) standards, and Automotive Electronics Council (AEC)-Q100 Standards are also discussed.

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References

  1. International Electrotechnical Commission (IEC), https://www.oecd.org/gov/regulatory-policy/IEC%20profile.pdf

  2. M. Hanif, Introduction to IEC standards, https://www.iec.freestandardsdocuments.com

  3. SEMI, https://en.wikipedia.org/wiki/SEMI

  4. SEMI International Standards: Compilation of Terms, (updated 2018)

    Google Scholar 

  5. N. Davis, The History and Basics of IPC Standards: The Official Standards for PCBs. (October 20, 2017). https://www.allaboutcircuits.com/news/ipc-standards-the-official-standards-for-pcbs/

  6. Z. Peterson, IPC Classes and Complying with IPC Standards for PCB Design. (June 4, 2021). https://resources.altium.com/p/complying-with-ipc-standards-for-pcb-design

  7. JEDEC, https://en.wikipedia.org/wiki/JEDEC

  8. Standards & Documents Search | JEDEC, https://www.jedec.org/standards-documents

  9. SEMI G30 – Test method for junction to case thermal resistance measurement of ceramic packages. G Series: Packaging

    Google Scholar 

  10. SEMI G24 – Test method for lead to lead and loading capacitance of package leads. G Series: Packaging

    Google Scholar 

  11. R. Oshiro, Fundamentals of AEC-Q100: What “Automotive Qualified” Really Means. https://media.monolithicpower.com/mps_cms_document/w/e/Webinar_-_Fundamentals_of_AEC-Q100-6Nov2018.pdf

  12. AEC Documents, http://www.aecouncil.com/AECDocuments.html

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Correspondence to Le Luo .

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Luo, L., Wang, J., Li, K. (2024). Standardization of Integrated Circuits Packaging. In: Wang, Y., Chi, MH., Lou, J.JC., Chen, CZ. (eds) Handbook of Integrated Circuit Industry. Springer, Singapore. https://doi.org/10.1007/978-981-99-2836-1_61

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