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Electromagnetic Metrology for Smart Technologies

Part II: Current, Voltage and Magnetic Metrology

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Metrology for Inclusive Growth of India

Abstract

In continuation to the Part I in the previous chapter, the Part II comprises of electromagnetic metrological parameters apart from microwaves, namely LF & HF voltage, LF current, magnetic metrology and Josephson voltage standard along with the application of Focused Ion Beam (FIB) in Metrology. Each parameter is first discussed in terms of its associated primary standards, their calibration and measurement capabilities (CMCs) and their degree of equivalence with the leading NMIs of the world, and on-going research for advanced measurements including quantum standards. Next, the impact of all the parameters on quality infrastructure creation at strategic, defense and industrial fronts is outlined. How ministries, regulators, manufacturers, industries, academia and research institution directly/indirectly benefit from these parameters in terms of calibration, testing, training, human resource development and technical consultancy is discussed. The chapter addresses questions related to the issues such as the measurement challenges, effect on industrial certification and technical consultation, challenges for regulators to catch up with upcoming series of modified standards-associated with the advancement of technology in electromagnetic domain. The importance of evolution of a strong link among the ministries, regulators, NMI (CSIR-NPL) and industries vis-a-vis these EM parameters to enhance export, improve the import quality and on overall economic growth of the country and ‘Aatmanirbhar Bharat’ are brought out.

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Acknowledgements

The authors would like to acknowledge all the ex-colleagues; present colleagues Ms. Sunidhi Madan, Mr. Anurag Katiyar, Ms. Mandeep Kaur, Mr. Anish Bhargav, Ms. Archana Sahoo, Ms. Jyoti Chauhan, Ms. Swati Kiumari, Mr. Mange Ram and Mr. Amreek Singh; and students of CSIR-NPL for their contributions in establishing Electromagnetic Metrology. We would also like to thank the stake holders Department of Legal Metrology, SAC-ISRO, PGCIL, STQC Labs, TEC-DoT, AAI, LM, M/s R&S India Pvt Ltd., M/s Valliant Comm. Pvt Ltd. and many others for their continuous support and collaboration in the National mission endeavors for Electromagnetic Metrology dissemination pan-India.

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  1. CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi, 110012, India

    S. K. Dubey, Saood Ahmad, C. K. Suman, Sandhya M. Patel, Sudhir Husale, Anurag G. Reddy, Anurag Gupta & D. K. Aswal

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    Dinesh K. Aswal

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Dubey, S.K. et al. (2020). Electromagnetic Metrology for Smart Technologies. In: Aswal, D.K. (eds) Metrology for Inclusive Growth of India. Springer, Singapore. https://doi.org/10.1007/978-981-15-8872-3_12

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  • DOI: https://doi.org/10.1007/978-981-15-8872-3_12

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