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Electromagnetic Metrology for Smart Technologies

Part I: Microwave Metrology

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Metrology for Inclusive Growth of India

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Abstract

Electromagnetic (EM) Metrology at CSIR-NPL comprises of various measurement facilities in frequency range from 1 Hz to 110 GHz of electromagnetic spectrum for devices from household electronic appliances to advanced strategic communication and instrumentation. Part-I of the chapter focuses on the Microwave range of the EM spectrum. With the advent of smart technologies, Microwave has reached each house and every individual, which makes precise and traceable electromagnetic measurements and hazardless interconnectivity very important. CSIR-NPL (NMI of the country) provides measurements for microwave frequencies from 9 kHz to 110 GHz frequency range that are precise, accurate, reliable, internationally recognized and traceable to the SI units through Microwave Metrology. The Microwave based National Standards and measurement capabilities are realized, established, maintained, and upgraded at CSIR-NPL. These standards are disseminated to reference laboratories across India to provide traceability to various sectors: strategic, defence, manufacturers, testing industries, government regulators and research institutions. Microwave metrology at CSIR-NPL has a unique combination of comprehensive capabilities of various parameters of Electromagnetics such as attenuation, microwave power, E-Field and specific absorption rate (SAR), along with various free space measurements parameters. Upcoming 5G technology is not just a routine technological change but a platform to enable several smart technologies such as smart banking, smart city, smart village, smart healthcare smart automobile and many more. This shows the overall impact of Microwave metrology on country’s upcoming technological needs. Based on impact analysis of dissemination of microwave metrology by the NMI of India, its role on technological revolution will be discussed in detail. This chapter comprises of closed system microwave parameters such as attenuation, impedance, insertion loss followed by free space microwave measurements such as Electric Filed, SAR, Shielding effectiveness, dielectric measurements along with advanced Quantum E-Field measurements traceable to Plank Constant. Each parameter is discussed in terms of its associated primary standards, their calibration and measurement capabilities (CMCs) and their degree of equivalence with the leading NMIs of the world, and on-going research for advanced measurements including quantum standards. Next section of all microwave metrology parameters deals with their impact on quality infrastructure creation at strategic, defence and industrial fronts. How ministries, regulators, manufacturers, industries, academia and research institution directly/indirectly benefit from these parameters in terms of calibration, testing, training, human resource development and technical consultancy is discussed in detail. Questions related to the issues such as—the measurement challenges, effect on industrial certification and technical consultation, challenges for regulators to catch up with upcoming series of modified standards—associated with the advent of technology in electromagnetic domain are dealt with. The importance of a strong link amongst the ministries, regulators, NMI (CSIR-NPL) and industries evolving as a game changer to enhance export and improve the quality of import will be discussed. The impact of electromagnetic metrology on overall economic growth of the country and ‘Aatmanirbhar Bharat’ are outlined.

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Acknowledgements

The authors would like to acknowledge all the ex-colleagues; present colleagues Ms. Sunidhi Madan, Mr. Anurag Katiyar, Ms. Mandeep Kaur, Mr. Anish Bhargav, Ms. Archana Sahoo, Ms. Jyoti Chauhan, Ms. Swati Kiumari, Mr. Mange Ram and Mr. Amreek Singh; and students of CSIR-NPL for their contributions in establishing Electromagnetic Metrology. We would also like to thank the stake holders Department of Legal Metrology, SAC-ISRO, PGCIL, STQC Labs, TEC-DoT, AAI, LM, M/s R&S India Pvt Ltd., M/s Valliant Comm. Pvt Ltd. and many others for their continuous support and collaboration in the National mission endeavours for Electromagnetic Metrology dissemination pan-India.

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  1. CSIR-National Physical Laboratory, Dr. K. S. Krishnan Marg, New Delhi, 110012, India

    S. K. Dubey, Saood Ahmad, C. K. Suman, Sandhya M. Patel, Sudhir Husale, Anurag G. Reddy, Anurag Gupta & D. K. Aswal

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  1. S. K. Dubey
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  2. Saood Ahmad
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Correspondence to Anurag Gupta .

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  1. CSIR-National Physical Laboratory, New Delhi, India

    Dinesh K. Aswal

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Dubey, S.K. et al. (2020). Electromagnetic Metrology for Smart Technologies. In: Aswal, D.K. (eds) Metrology for Inclusive Growth of India. Springer, Singapore. https://doi.org/10.1007/978-981-15-8872-3_11

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