Abstract
An electronic system contains millions of components on a single chip today, and the failure of any of these components may lead to the system failure. Conventionally, the system reliability is ensured by having a high reliable subsystem or component, and thus efforts are placed to study the reliability of individual components in electronic system. However, the failure mechanisms of a system is lot more complex, and the correlation between the system failure and component failure is not straight forward, depending on the system configuration, as demonstrated in this work. Therefore, electronic system reliability may not be derived from its components’ reliability.
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Lan, S., Tan, C.M. (2017). The Correlation Between Device Aging and System Degradation. In: Tan, C., Goh, T. (eds) Theory and Practice of Quality and Reliability Engineering in Asia Industry. Springer, Singapore. https://doi.org/10.1007/978-981-10-3290-5_22
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DOI: https://doi.org/10.1007/978-981-10-3290-5_22
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