The Exponential-Poisson Regression Model for Recurrent Events: A Bayesian Approach

  • Conference paper
  • First Online:
Interdisciplinary Bayesian Statistics

Abstract

In this chapter, we introduce a new regression model for recurrent event data, in which the time of each recurrence is associated to one or multiple latent causes and no information is provided about the cause responsible for the event occurrence. This model is characterized by a fully parametric rate function and it is based on the exponential-Poisson distribution. The time of each recurrence is then given by the minimum lifetime value among all latent causes. Inference aspects of the proposed model are discussed via Bayesian inference by using Markov Chain Monte Carlo (MCMC) method. A simulation study investigates the frequentist properties of the posterior estimators for different sample sizes. A real-data application demonstrates the use of the proposed model.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

Chapter
USD 29.95
Price excludes VAT (Canada)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 84.99
Price excludes VAT (Canada)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Hardcover Book
USD 109.99
Price excludes VAT (Canada)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free ship** worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Similar content being viewed by others

Notes

  1. 1.

    The data can be found on http://www.umass.edu/statdata/statdata/data

References

  1. Aalen, O.O., Borgan, O., Gjessing, H.K.: Survival and Event History Analysis: A Process Point of View. Springer, New York (2008)

    Google Scholar 

  2. Andersen, P.K., Borgan, O., Gill, R.D., Keiding, N.: Statistical Models Based on Counting Processes. Springer, New York (1993)

    Book  MATH  Google Scholar 

  3. Andersen, P.K., Gill, R.D.: Cox’s regression model for counting processes: a large sample study. Ann. Stat. 10, 1100–1120 (1982)

    Article  MATH  MathSciNet  Google Scholar 

  4. Chib, S., Greenberg, E.: Understanding the Metropolis–Hastings algorithm. Am. Stat. 49, 327–335 (1995)

    Google Scholar 

  5. Cook, R.J., Lawless, J.F.: The statistical analysis of recurrent events. Springer, New York (2007)

    Google Scholar 

  6. Gelman, A., Rubin, D.B.: Inference from iterative simulation using multiple sequences. Stat. Sci. 4, 457–472 (1992)

    Article  Google Scholar 

  7. Hosmer, D.W., Lemeshow, S., May, S.: Applied Survival Analysis: Regression Modeling of Time to Event Data. Wiley, New York (2008)

    Book  Google Scholar 

  8. Huang, C.Y., Luo, X., Follmann, D.A.: A model checking method for the proportional hazards model with recurrent gap time data. Biostatistics 12, 535–547 (2011)

    Article  MATH  Google Scholar 

  9. Ibrahim, J.G., Chen, M.H., Sinha, D.: Bayesian Survival Analysis. Springer, New York (2005)

    Google Scholar 

  10. Kalbfleisch, J.D., Prentice, R.L.: The Statistical Analysis of Failure Time Data. Wiley, New Jersey (2002)

    Book  MATH  Google Scholar 

  11. Kus, C.: A new lifetime distribution. Comput. Stat. Data Anal. 51, 4497–4509 (2007)

    Article  MATH  MathSciNet  Google Scholar 

  12. Lawless, J.F.: Statistical Models and Methods for Lifetime Data. Wiley, New Jersey (2003)

    MATH  Google Scholar 

  13. Lawless, J.F., Nadeau, C.: Some simple robust methods for the analysis of recurrent events. Technometrics pp. 158–168 (1995)

    Google Scholar 

  14. Paulino, C.D.M., Turkman, M.A.A., Murteira, B.: Estatistica Bayesiana. Fundacao Calouste, Gulbenkian (2003)

    Google Scholar 

  15. Pena, E.A., Slate, E.H., Gonzalez, J.R.: Semiparametric inference for a general class of models for recurrent events. J. Stat. Plan. Inference 137(6), 1727–1747 (2007)

    Article  MATH  MathSciNet  Google Scholar 

  16. Prentice, R.L., Williams, B.J., Peterson, A.V.: On the regression analysis of multivariate failure time data. Biometrika 68, 373–379 (1981)

    Article  MATH  MathSciNet  Google Scholar 

  17. R Development Core Team: R: A Language and Environment for Statistical Computing. R Foundation for Statistical Computing, Vienna (2013)

    Google Scholar 

  18. Rubinstein, R.Y., Kroese, D.P.: Simulation and the Monte Carlo Method. Wiley-Interscience, New Jersey (2008)

    Google Scholar 

  19. Xu, Y., Cheung, Y.B., Lam, K.F., Milligan, P.: Estimation and interpretation of incidence rate difference for recurrent events when the estimation model is misspecified. Biometrical Journal 54, 750–765 (2012)

    Google Scholar 

  20. Zhao, X., Zhou, X.: Modeling gap times between recurrent events by marginal rate function. Comput. Stat. Data Anal. 56, 370–383 (2012)

    Article  MATH  MathSciNet  Google Scholar 

  21. Zhao, X.B., Zhou, X., Wang, J.L.: Semiparametric model for recurrent event data with excess zeros and informative censoring. J. Stat. Plan. Inference 142(1), 289–300 (2012)

    Article  MATH  MathSciNet  Google Scholar 

Download references

Acknowledgements

This work was partially funded by the Brazilian institutions FAPESP, CAPES, and CNPq.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Márcia A. C. Macera .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2015 Springer International Publishing Switzerland

About this paper

Cite this paper

Macera, M., Louzada, F., Cancho, V. (2015). The Exponential-Poisson Regression Model for Recurrent Events: A Bayesian Approach. In: Polpo, A., Louzada, F., Rifo, L., Stern, J., Lauretto, M. (eds) Interdisciplinary Bayesian Statistics. Springer Proceedings in Mathematics & Statistics, vol 118. Springer, Cham. https://doi.org/10.1007/978-3-319-12454-4_29

Download citation

Publish with us

Policies and ethics

Navigation