An Optimal Tester for k-Linear

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WALCOM: Algorithms and Computation (WALCOM 2022)

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Abstract

A Boolean function \(f:\{0,1\}^n\rightarrow \{0,1\}\) is k-linear if it returns the sum (over the binary field \(F_2\)) of k coordinates of the input. In this paper, we study property testing of the classes k-Linear, the class of all k-linear functions, and k-Linear\(^*\), the class \(\cup _{j=0}^kj\)-Linear. We give a non-adaptive distribution-free two-sided \(\epsilon \)-tester for k-Linear that makes

$$O\left( k\log k+\frac{1}{\epsilon }\right) $$

queries. This matches the lower bound known from the literature.

We then give a non-adaptive distribution-free one-sided \(\epsilon \)-tester for k-Linear\(^*\) that makes the same number of queries and show that any non-adaptive uniform-distribution one-sided \(\epsilon \)-tester for k-Linear must make at least \( \tilde{\varOmega }(k)\log n+\varOmega (1/\epsilon )\) queries. The latter bound, almost matches the upper bound \(O(k\log n+1/\epsilon )\) known from the literature. We then show that any adaptive uniform-distribution one-sided \(\epsilon \)-tester for k-Linear must make at least \(\tilde{\varOmega }(\sqrt{k})\log n+\varOmega (1/\epsilon )\) queries.

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Notes

  1. 1.

    The class of boolean functions that depends on at most k coordinates.

  2. 2.

    w.r.t. the uniform distribution, i.e., where \(f_1\) and \(f_2\) are distinct linear functions.

  3. 3.

    That is, defining a function \(f(x_{\phi (1)},\ldots ,x_{\phi (n)})\) where \(\phi :[n]\rightarrow [r]\) is random uniform.

  4. 4.

    We may assume that \(k\leqslant \sqrt{n}.\) This is because the one-sided non-adaptive testing in [13] asks \(O(k\log n+1/\epsilon )\) queries which is \(O(k\log k+1/\epsilon )\) queries for \(k>\sqrt{n}\).

  5. 5.

    Coordinates that the function depends on.

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Correspondence to Nader H. Bshouty .

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Bshouty, N.H. (2022). An Optimal Tester for k-Linear. In: Mutzel, P., Rahman, M.S., Slamin (eds) WALCOM: Algorithms and Computation. WALCOM 2022. Lecture Notes in Computer Science(), vol 13174. Springer, Cham. https://doi.org/10.1007/978-3-030-96731-4_17

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  • DOI: https://doi.org/10.1007/978-3-030-96731-4_17

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