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Showing 1-11 of 11 results
  1. Measurement of the thermal parameters of semiconductor products using pulse-amplitude modulation of the heating power

    Estimates of the systematic error in measuring a temperature-sensitive parameter of a semiconductor article are obtained. These errors are due to...

    V. A. Sergeev, V. V. Yudin in Measurement Techniques
    Article 01 October 2010
  2. Comparative analysis of models of the dielectric properties of soil in self-excited oscillator measurements of moisture content

    A semi-empirical approach to choosing a model for realizing self-excited oscillator instruments for measuring moisture content by analyzing existing...

    V. G. Lisichkin, S. N. Shvedov in Measurement Techniques
    Article 01 February 2008
  3. Effect of the Conductance and Thickness of a Conducting Plate on the Signal from a Material–Velocity Inductive Transducer

    The perturbation problem of the magnetic field of a constant–current turn located above a conducting plate set into motion by a plane shock wave with...

    Yu. N. Zhugin, Yu. L. Levakova in Journal of Applied Mechanics and Technical Physics
    Article 01 November 2000
  4. Method of measuring the parameters of microwave transistors

    A new method is proposed for measuring the parameters of microwave transistors as quadripoles. The parameters are determined from the scattering...

    S. I. Podkovyrin in Measurement Techniques
    Article 01 December 1996
  5. Reproduction of the volt unit by means of long-lived niobium single-crystal Josephson junctions

    V. I. Krzhimovskii, Kh. A. Ainitdinov, ... A. S. Gokhner in Measurement Techniques
    Article 01 February 1983
  6. Automatic measuring setup based on DRG2-01 radiation monitor

    N. D. Villeval'de, Yu. A. Volkov, A. V. Oborin in Measurement Techniques
    Article 01 January 1983
  7. Precision measurement of energy flux density

    T. N. Novoselova, V. V. Skotnikov in Measurement Techniques
    Article 01 January 1983
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