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Showing 1-20 of 8,436 results
  1. A Cu Pillar Bump Bonding Method Using Au-Sn Alloy Cap as the Interconnection Layer

    High-temperature and flux-free bonding is important for heterogeneous integration of different chips. In this work, a Cu pillar bump was prepared by...

    Yuhua Hu, Yan Zhang, ... Min Huang in Journal of Electronic Materials
    Article 17 January 2024
  2. Wetting behavior of eutectic Au–Sn solder on Ni/Au metallization at different temperatures

    Au–Sn solder is a high reliable lead-free solder with excellent oxidation resistance which is commonly used in fluxless soldering. In this paper, the...

    Jie Wang, Yi** Wu, ... Yangquan **e in Journal of Materials Science: Materials in Electronics
    Article 23 January 2022
  3. Effect of Ni on the Au embrittlement in Sn/Au/Ni solder bump

    The effect of Ni on the gold embrittlement in the Sn/Au/Ni solder bump was studied in this paper. The mechanical properties of (Au 1−x ,Ni x )Sn 4 ( x = 0,...

    Tao Wang, Hailong Li, ... Xuehong Zhang in Journal of Materials Science: Materials in Electronics
    Article 20 October 2021
  4. Microstructure and shear strength of Au-20wt%Sn solder joints fabricated by thermo-compression bonding for LED packages

    Solder joints of Au-20wt%Sn (Au-20Sn) between real light-emitting diode Si chips and AlN substrates were fabricated using thermo-compression (TC)...

    Dong-hun Lee, Jae-il Jang, Young-Ho Kim in Journal of Materials Science: Materials in Electronics
    Article 27 March 2022
  5. Grain Boundary Diffusion of Ni through Au-Doped Ni3Sn2 Intermetallic Compound for Technological Applications

    In recent years Au-Sn solid–liquid interdiffusion (SLID) has become a widely known bonding method to deliver promising die attaching techniques for...

    Z. X. Zhu, Vengudusamy Renganathan, C. R. Kao in Journal of Electronic Materials
    Article 20 October 2021
  6. In situ TEM Characterization of Phase Transformations and Kirkendall Void Formation During Annealing of a Cu–Au–Sn–Cu Diffusion Bonding Joint

    Diffusion bonding with Au, Cu and Sn is a technique that can be used to manufacture printed circuit boards. The mechanisms of reactive diffusion and...

    L. Cornet, L. Yedra, ... M.-L. Giorgi in Journal of Electronic Materials
    Article 18 January 2022
  7. Effect of the Welding Process on the Microstructure and Mechanical Properties of Au/Sn–3.0Ag–0.5Cu/Cu Solder Joints

    This paper investigates the influence of the welding process on the microstructure and mechanical properties of Au/Sn–3.0Ag–0.5Cu/Cu solder joints....

    **nmeng Zhai, Yue Chen, ... Bobo Yang in Journal of Electronic Materials
    Article 19 January 2022
  8. Effect of Ni, Zn, Au, Sb and In on the Suppression of the Cu3Sn Phase in Sn-10 wt.%Cu Alloys

    Since manufacturing is transitioning into Pb-free solder development for electronic assembly and packaging, consumer demands for more compact...

    Syeda U. Mehreen, Kazuhiro Nogita, ... David H. StJohn in Journal of Electronic Materials
    Article 19 January 2021
  9. Comparative study of laser- and reflow-soldered Sn–3.0Ag–0.5Cu joints on thin Au/Pd/Ni(P) substrate

    High-precision and high-density bonding methods are gaining research interest owing to need for the miniaturization of semiconductor devices and...

    Dong-Hwan Lee, Min-Seong Jeong, Jeong-Won Yoon in Journal of Materials Science: Materials in Electronics
    Article 20 January 2023
  10. Research on Microstructure and Shear Behavior of Au/Sn-Ag-Cu/Cu Lead-free Solder Joints at Different Soldering Temperatures

    In the actual production process, soldering is a key step in the flip-chip packaging process. The reliability of the interconnection interface of...

    **nmeng Zhai, Yue Chen, ... Qijun Bao in Journal of Electronic Materials
    Article 29 July 2021
  11. Comparative study of normal and thin Au/Pd/Ni(P) surface finishes with Sn–3.0Ag–0.5Cu solder joints under isothermal aging

    A comparison study of the interfacial reactions and mechanical shear strengths of normal and thin electroless-nickel electroless-palladium immersion...

    Jong-Hoon Back, Jeong-Won Yoon in Journal of Materials Science: Materials in Electronics
    Article 06 September 2021
  12. Increasing shear strength of Au–Sn bonded joint through nano-grained interfacial reaction products

    Intermetallic compounds (IMCs) form at the solder/substrate interface during soldering, providing metallurgical bonding. However, cracks tend to...

    Jian Peng, Meng Wang, ... Pasquale Cavaliere in Journal of Materials Science
    Article 08 January 2021
  13. Effects of Ni(P) layer thickness and Pd layer type in thin-Au/Pd/Ni(P) surface finishes on interfacial reactions and mechanical strength of Sn–58Bi solder joints during aging

    To analyze the effects of Ni(P) layer thickness and Pd layer composition on interfacial reactions and the mechanical reliabilities of Sn–58Bi solder...

    Jungsoo Kim, Seung-Boo Jung, Jeong-Won Yoon in Journal of Materials Science: Materials in Electronics
    Article 27 September 2020
  14. The Effect of Thermal Aging on the Mechanical Properties of Gold-Containing Solder Joints

    The reliability of SnPbAg solder joints containing gold (Au) under different aging conditions have been investigated. The solder joints were prepared...

    Yinghao Bi, Weiqi Guo, ... ** Wu in Journal of Electronic Materials
    Article 28 June 2024
  15. Interface Embrittlement Between 63Sn-37Pb Solder and Au Layer. Part 2: Quantitative Compositional Analysis of Intermetallic Compound Reaction Layers

    The interface gold (Au) embrittlement failure mode resulting when a Au protective finish is not completely removed by the soldering process. has been...

    P. T. Vianco, A. C. Kilgo, ... S. Williams in Journal of Electronic Materials
    Article 27 October 2022
  16. Pulse electric current induced interfacial ductile phase on improving the mechanical properties of the Au20Sn/Cu solder joints

    Forming ductile phase is an effective way to release stress localization and suppress crack initiation in interfacial reaction products, which...

    Chuanlei Liu, Meng Wang, ... Huashan Liu in Journal of Materials Science: Materials in Electronics
    Article 22 June 2024
  17. Effect of Au Do** on Elastic, Thermodynamic, and Electronic Properties of η-Cu6Sn5 Intermetallic

    The effects of substitution of Au for Cu on the elastic, thermodynamic, and electronic properties of hexagonal η-Cu 6 Sn 5 intermetallic compound (IMC)...

    **ang Lin, Weiwei Zhang, ... ** Wu in Journal of Electronic Materials
    Article 12 February 2020
  18. Interface Embrittlement Between 63Sn-37Pb Solder and Au Layer—Part 1: Physical Metallurgy of Liquid-State and Solid-State Reactions

    This study examined the interface microstructure that developed between 63Sn-37Pb (Sn-Pb) solder and the Au protective layer that was not fully...

    P. T. Vianco, A. C. Kilgo, ... S. Williams in Journal of Electronic Materials
    Article 30 August 2022
  19. Application of metal interconnection process with micro-LED display by laser-assisted bonding technology

    Bonding between the micro-LED chip and the substrate soldered joint has become a key bottleneck after the mass transfer process of moving individual...

    Wenya Tian, Zehao Ma, ... **uqi Huang in Journal of Materials Science: Materials in Electronics
    Article 08 December 2023
  20. Au nanoparticle-modified ZnO/SnO2 heterojunction nanocomposites for highly sensitive detection of NH3

    The development of resistive NH 3 gas sensor detection technology has important practical significance for environmental protection and human health...

    Qiuya Liu, Ran Zhao, ... Zhurui Shen in Journal of Materials Science: Materials in Electronics
    Article 22 March 2024
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