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Showing 341-360 of 433 results

  1. Determination of trace elements in semiconductor materials by neutron activation analysis using the radioisotope addition technique

    The determination of trace elements in highly activated matrix components was carried out by neutron activation analysis using the radioisotope...

    K. Kobayashi, K. Kudo in Journal of Radioanalytical and Nuclear Chemistry
    Article 01 November 1984

  2. Laser Photolytic Deposition of Metals on Indium Phosphide

    Current interests at British Telecom Research Laboratories include advanced optoelectronic and integrated optics device structures in III–V...
    M. R. Aylett, J. Halgh in Laser Processing and Diagnostics
    Conference paper 1984

  3. Determination of residual impurities in InP grown by the Czochralski method, using charged particle activation analysis

    InP samples were analyzed by charged particle activation analysis. Proton activation at 12 MeV permits the nondestructive survey of 30 elements. The...

    R. Lacroix, G. Blondiaux, ... M. Gauneau in Journal of Radioanalytical and Nuclear Chemistry
    Article 01 July 1984

  8. Anodic characteristics of amorphous ternary palladium-phosphorus alloys containing ruthenium, rhodium, iridium, or platinum in a hot concentrated sodium chloride solution

    Amorphous ternary palladium-based alloys containing platinum group metals as an additional element were prepared by rapid quenching from the molten...

    M. Hara, K. Hashimoto, T. Masumoto in Journal of Applied Electrochemistry
    Article 01 May 1983

  12. Profiles of Implanted or Diffuses Dopants (Be, Zn, Cr, Se) in Indium Phosphide

    Indium phosphide is of technological interest since it has been shown that optical fiber communications systems in the 1.1–1.6 µm range could be...
    M. Gauneau, A. Rupert, P. N. Favennec in Secondary Ion Mass Spectrometry SIMS III
    Conference paper 1982

  14. Spark source mass spectrometry in the research laboratories of an electronic industry

    Spark-source mass spectrometry is suitable for qualitative and quantitative analysis of inorganic materials. 83 elements can be determined with...

    J. A. J. Jansen, A. W. Witmer in Fresenius' Zeitschrift für analytische Chemie
    Article 01 January 1981

  16. Part IV. Review and evaluation of spark source mass spectrometry as an analytical method

    The analytical features and most important fields of application of spark source mass spectrometry are described with respect to the trace analysis...

    H. E. Beske, R. Gijbels, ... K. P. Jochum in Fresenius' Zeitschrift für analytische Chemie
    Article 01 January 1981

  18. SIMS Studies in Compound Semiconductors

    In recent years, the SIMS technique has approached significantly closer to the desired role as a universal microanalytical technique with...
    J. E. Baker, P. Williams, ... B. G. Streetman in Secondary Ion Mass Spectrometry SIMS II
    Conference paper 1979

  19. Determination of trace levels of oxygen by gamma-photon activation

    A sensitive activation technique for the determination of trace levels of oxygen in a wide range of materials is described with particular emphasis...

    D. R. Williams, J. S. Hislop, ... D. A. Wood in Journal of Radioanalytical Chemistry
    Article 01 March 1979
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