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    Multi-Band Electron Paramagnetic Resonance Study of Microcrystalline and Cluster Silicon Embedded in SiO2

    Dangling bond defects (DB) in silicon microcrystallines and clusters embedded in SiO2 have been studied by X- and Q-band electron paramagnetic resonance (EPR) spectroscopy. The EPR spectra due to the DB were rema...

    Takashi Ehara, Tadaaki Ikoma, Shozo Tero-Kubota in MRS Online Proceedings Library (2000)