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  1. No Access

    Article

    Profiling of the SiO2 - SiC Interface Using X-ray Photoelectron Spectroscopy

    The implementation of SiC based sensors and electronics for operation in chemically harsh, high temperature environments depends on understanding the SiO2/SiC interface in field effect devices. We have developed ...

    R. N. Ghosh, S. Ezhilvalavan, B. Golding… in MRS Online Proceedings Library (2011)

  2. No Access

    Article

    Preparation and properties of tantalum pentoxide (Ta2O5) thin films for ultra large scale integrated circuits (ULSIs) application – A review

    Tantalum pentoxide (Ta2O5) thin films have rapidly evolved into an important field of research/development for both basic and applied science with the promise of creating a new generation of advanced micro device...

    S. Ezhilvalavan, T. Y. Tseng in Journal of Materials Science: Materials in Electronics (1999)

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    Article

    Dependence of non-linearity coefficients on transition metal oxide concentration in simplified compositions of ZnO+Bi2O3+MO varistor ceramics (M=Co or Mn)

    Ceramics with simplified compositions of ZnO + Bi2O3 + CoO or MnO show non-linearity coefficients (α) of 40–65 provided the concentration of transition metal ions is > 1.5mol.... Samples doped with Co have higher...

    S. Ezhilvalavan, T.R.N. Kutty in Journal of Materials Science: Materials in Electronics (1996)