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  1. No Access

    Article

    Investigation of Submicron Linewidth Direct Deposition for High-Density IC Chip Modification by Focused Ion Beam

    Y.Q. Fu, N.K.A. Bryan, O.N. Shing in The International Journal of Advanced Manu… (2001)

  2. No Access

    Article

    Influence of the Redeposition effect for Focused Ion Beam 3D Micromachining in Silicon

    Y.Q. Fu, N.K.A. Bryan, O.N. Shing, N.P. Hung in The International Journal of Advanced Manu… (2000)

  3. No Access

    Article

    Data Format Transferring for FIB Microfabrication

    Y. Q. Fu, N. K. A. Bryan, O. A. San… in The International Journal of Advanced Manu… (2000)