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    Atomic force microscopy on polymers and polymer related compounds

    Surface morphology and molecular arrangement have been recorded by atomic force microscopy (AFM) on polytetrafluoroethylene (PTFE) and on polycarbonate (PC) films. In a thin layer of PTFE deposited by rubbing ...

    S. N. Magonov, S. Kempf, M. Kimmig, H.-J. Cantow in Polymer Bulletin (1991)