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    Correlation between Morphological Structure and Optoelectronic Properties of Al2O3 thin layer coated silicon nanowires

    This study reports on correlation between morphological structure and optoelectronic properties of Al2O3/silicon nanowires (SiNWs). The SiNWs were prepared from etching a silicon substrate via a silver supported ...

    A. Hajjaji, C. Amri, A. Rebhi, M. Gaidi, R. Ouertani, M. Amlouk, B. Bessais… in Silicon (2021)