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8 Result(s)

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  1. No Access

    Article

    Self-ion irradiation effects on mechanical properties of nanocrystalline zirconium films

    Zirconium thin films were irradiated at room temperature with an 800 keV Zr+ beam using a 6 MV HVE Tandem accelerator to 1.36 displacement per atom damage. Freestanding tensile specimens, 100 nm thick and 10 nm g...

    Baoming Wang, M. A. Haque, Vikas Tomar, Khalid Hattar in MRS Communications (2017)

  2. No Access

    Article

    Thermal Conductivity Measurement of Low-k Dielectric Films: Effect of Porosity and Density

    The thermal conductivity of low-dielectric-constant (low-k) SiOC:H and SiC:H thin films has been measured as a function of porosity using a heat transfer model based on a microfin geometry and infrared thermometr...

    M. T. Alam, R. A. Pulavarthy, J. Bielefeld, S. W. King… in Journal of Electronic Materials (2014)

  3. No Access

    Article

    Atomic Mobilities in the Ag-Cu-Sn Face-Centered Cubic Lattice

    Knowledge of atomic mobilities is necessary to predict the evolution of microstructure. The theoretical description of atomic mobilities is connected to the chemical potentials of the components in a given pha...

    W. Gierlotka, Y.H. Chen, M.A. Haque, M.A. Rahman in Journal of Electronic Materials (2012)

  4. No Access

    Article

    MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements

    Mechanical testing of micro- and nanoscale materials is challenging due to the intricate nature of specimen preparation and handling and the required load and displacement resolution. In addition, in Situ testing...

    M. A. Haque, H. D. Espinosa, H. J. Lee in MRS Bulletin (2010)

  5. No Access

    Article

    A review of MEMS-based microscale and nanoscale tensile and bending testing

    Thin films at the micrometer and submicrometer scales exhibit mechanical properties that are different than those of bulk polycrystals. Industrial application of these materials requires accurate mechanical ch...

    M. A. Haque, M. T. A. Saif in Experimental Mechanics (2003)

  6. No Access

    Article

    In-situ tensile testing of nano-scale specimens in SEM and TEM

    We present a new experimental method for the mechanical characterization of freestanding thin films with thickness on the order of nanometers to micrometers. The method allows, for the first time, in-situ SEM ...

    M. A. Haque, M. T. A. Saif in Experimental Mechanics (2002)

  7. No Access

    Chapter and Conference Paper

    In-situ Mechanical Characterization of a 100 Nanometer Thick Freestanding Aluminum Film in TEM Using MEMS Force Sensors

    We present a new experimental method for mechanical characterization of freestanding thin films with thicknesses on the order of nanometers to micrometers. The method utilizes MEMS force sensors and allows, fo...

    M. A. Haque, M. T. A. Saif in Transducers ’01 Eurosensors XV (2001)

  8. No Access

    Article

    The lateral photovoltaic effect in CdS-Cu2S heterojunction solar cell

    The lateral photovoltaic effect has been observed in CdS-Cu2S thin-film solar cells. The effect is more pronounced on the CdS side than on the Cu2S side of the cells. On the CdS side, where the contacts were form...

    M. N. Islam, M. A. Haque in Applied Physics A (1982)