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within M. A. Haque Remove this filter English Remove this filter Characterization and Evaluation of Materials Remove this filter Electronics and Microelectronics, Instrumentation Remove this filter Optical and Electronic Materials Remove this filter

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  1. No Access

    Article

    Atomic Mobilities in the Ag-Cu-Sn Face-Centered Cubic Lattice

    Knowledge of atomic mobilities is necessary to predict the evolution of microstructure. The theoretical description of atomic mobilities is connected to the chemical potentials of the components in a given pha...

    W. Gierlotka, Y.H. Chen, M.A. Haque, M.A. Rahman in Journal of Electronic Materials (2012)

  2. No Access

    Article

    Thermal Conductivity Measurement of Low-k Dielectric Films: Effect of Porosity and Density

    The thermal conductivity of low-dielectric-constant (low-k) SiOC:H and SiC:H thin films has been measured as a function of porosity using a heat transfer model based on a microfin geometry and infrared thermometr...

    M. T. Alam, R. A. Pulavarthy, J. Bielefeld, S. W. King… in Journal of Electronic Materials (2014)