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Article
Self-ion irradiation effects on mechanical properties of nanocrystalline zirconium films
Zirconium thin films were irradiated at room temperature with an 800 keV Zr+ beam using a 6 MV HVE Tandem accelerator to 1.36 displacement per atom damage. Freestanding tensile specimens, 100 nm thick and 10 nm g...
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Article
MEMS for In Situ Testing—Handling, Actuation, Loading, and Displacement Measurements
Mechanical testing of micro- and nanoscale materials is challenging due to the intricate nature of specimen preparation and handling and the required load and displacement resolution. In addition, in Situ testing...
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Article
In situ tensile testing of nanoscale freestanding thin films inside a transmission electron microscope
The unique capability of rendering opaque specimens transparent with atomic resolution makes transmission electron microscopy (TEM) an indispensable tool for microstructural and crystallographic analysis of ma...
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Article
A novel MEMS nano-tribometer for dynamic testing in-situ in SEM and TEM
We present the design and fabrication of a micro-electro-mechanical (MEMS) tribometer with normal and lateral force resolutions of 100 and 1 nano-Newton, respectively and bandwidth of 50 kHz. The small size of...