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  1. Article

    Open Access

    Composition Analysis of III-Nitrides at the Nanometer Scale: Comparison of Energy Dispersive X-ray Spectroscopy and Atom Probe Tomography

    The enhancement of the performance of advanced nitride-based optoelectronic devices requires the fine tuning of their composition, which has to be determined with a high accuracy and at the nanometer scale. Fo...

    Bastien Bonef, Miguel Lopez-Haro, Lynda Amichi, Mark Beeler… in Nanoscale Research Letters (2016)

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