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    Characterization of the Electronic Structure and Optical Properties of Al2O3, ZrO2 and SrTiO3 from Analysis of Reflection Electron Energy Loss Spectroscopy in the Valence Region

    Characterization of thin surficial films of oxides has become the focus of increased interest due to their applications in microelectronics. The ability to experimentally determine the electronic structure and...

    G. L. Tan, L. K. Denoyer, R. H. French, A. Ramos… in MRS Online Proceedings Library (2004)