Skip to main content

and
  1. Article

    Erratum to: Charge transfer in graphene/polymer interfaces for CO2 detection

    The order of the authors in the original version of this article was unfortunately incorrect on the first page and the first page of the ESM.

    Kihyeun Kim, Myungwoo Son, Yusin Pak, Sang-Soo Chee, Francis Malar Auxilia in Nano Research (2018)

  2. No Access

    Article

    Charge transfer in graphene/polymer interfaces for CO2 detection

    Understanding charge transfer processes between graphene and functional materials is crucial from the perspectives of fundamental sciences and potential applications, including electronic devices, photonic dev...

    Myungwoo Son, Yusin Pak, Sang-Soo Chee, Francis Malar Auxilia, Kihyeun Kim in Nano Research (2018)

  3. No Access

    Article

    Investigation of Amorphous IGZO TFT Employing Ti/Cu Source/Drain and SiNx Passivation

    We successfully fabricated a-IGZO TFTs employing a Ti/Cu source/drain (S/D) and SiNx passivation in order to reduce the line-resistance, as compared to most oxide TFTs that use Mo (or TCO) and SiO2 for their S/D ...

    Young Wook Lee, Sung-Hwan Choi, Jeong-Soo Lee in MRS Online Proceedings Library (2011)

  4. No Access

    Article

    Microstructural Evolution of Nickel Induced Crystallization of Amorphous Silicon

    The Ni silicide-mediated phase transformation of amorphous to crystalline silicon (c-Si) was studied using transmission electron microscopy. Amorphous silicon (a-Si) films coated with very thin Ni layer (∼10-1Å) ...

    Kyu Ho Park, Young Woo Jeong, Hyun Ja Kwon, Jeong Soo Lee in MRS Online Proceedings Library (2011)

  5. No Access

    Article

    The effect of active-layer thickness on the characteristic of nanocrystalline silicon thin film transistor

    We fabricated nc-Si TFTs in order to investigate the effect of the active-layer thickness on the characteristic of the nc-Si TFT. Bottom gate nc-Si TFTs were fabricated at 350°C using ICP-CVD. The thicknesses ...

    Sun-Jae Kim, Sang-Myeon Han, Seung-Hee Kuk, Jeong-Soo Lee in MRS Online Proceedings Library (2009)

  6. No Access

    Article

    Rocking-Angle Ion-Milling of Cross-Sectional Samples for Transmission Electron Microscopy of Multi-Layer Systems

    The cross-sectional transmission electron microscopy (TEM) specimens of Pt/Ti/SiO2/Si, RuO2/SiO2/Si, W/TiN/SiO2/Si, (Pb,La)TiO3/Pt/MgO, Bi4Ti3O12/Lal-xCaxMnO3/MgO, and GaN/Al2O3 were successfully made by the rock...

    Jeong Soo Lee, Hyun Ha Kim, Young Woo Jeong in MRS Online Proceedings Library (1997)

  7. No Access

    Article

    Microstructural Characterization of Pt/Ti and RuO2 Electrodes on SiO2/Si Annealed in the Oxygen Ambient

    Microstructures and interdiffusions of Pt/Ti/SiO2/Si and RuO2/SiO2/Si during annealing in O2 were investigated using x-ray diffraction, Auger electron spectroscopy, scanning electron microscopy, and transmission ...

    Jeong Soo Lee, Hyun Ja Kwon, Young Woo Jeong, Hyun Ha Kim in MRS Online Proceedings Library (1996)

  8. No Access

    Article

    Microstructures and electrical resistivities of the RuO2 electrode on SiO2/Si annealed in the oxygen ambient

    The electrical resistivity property of RuO2 thin films grown on the SiO2/Si substrate by reactive dc sputtering was examined in terms of microstructure using x-ray diffraction and cross-sectional transmission ele...

    Jeong Soo Lee, Hyun Ja Kwon, Young Woo Jeong, Hyun Ha Kim in Journal of Materials Research (1996)

  9. No Access

    Article

    Epitaxial Growth and Physical Properties of La1-xCaxMnO3-δ Thin Films on MgO(001) Substrates

    Perovskite La1-xCaxMnO3-δ (LCMO) thin films with a wide range of x, i.e., 0.0 ≤ x ≤ 0.6, were deposited on MgO(001) substrates using a pulsed laser deposition (PLD) technique. Epitaxial La0.7Ca0.3MnO3-δ/MgO thin ...

    J. Y. Gu, K. H. Kim, T. W. Noh, Jeong Soo Lee in MRS Online Proceedings Library (1995)

  10. No Access

    Article

    Microstructures and interdiffusions of Pt/Ti electrodes with respect to annealing in the oxygen ambient

    The microstructural variation and the interdiffusion of Pt (80 nm)/Ti (70 nm)/SiO2/Si during annealing in O2 were investigated using Auger electron spectroscopy, x-ray diffraction, transmission electron microscop...

    Kyu Ho Park, Cha Yeon Kim, Young Woo Jeong, Hyun Ja Kwon in Journal of Materials Research (1995)