Skip to main content

4 Result(s)

within J. Cook Remove this filter Materials Science Remove this filter

and

  1. No Access

    Article

    Microstructural Characterization of CdTe Surface Passivation Layers

    The microstructure of CdTe (CT) surface passivation layers deposited on HgCdTe (MCT) heterostructures has been evaluated using transmission electron microscopy (TEM). The MCT heterostructures were grown by liq...

    W.F. Zhao, J. Cook, T. Parodos, S. Tobin, David J. Smith in Journal of Electronic Materials (2010)

  2. No Access

    Article

    Influence of 4H-SiC semi-insulating substrate purity on SiC metal-semiconductor field-effect transistor performance

    The performances of silicon carbide (SiC) metal-semiconductor field-effect transistors (MESFETs) fabricated on conventional V-doped semi-insulating substrates and new V-free semi-insulating substrates have bee...

    A. P. Zhang, L. B. Rowland, E. B. Kaminsky, J. B. Tucker… in Journal of Electronic Materials (2003)

  3. No Access

    Article

    Minimization of Di Water Consumption In Wet Clean Rinse Tanks

    The use of resistivity-monitored dump-rinse tanks in semiconductor wet processing allows the rinse process to be optimized, substantially reducing DI water consumption while minimizing the deleterious effects ...

    J. Cook in MRS Online Proceedings Library (1996)

  4. No Access

    Chapter

    In Situ Laser Beam Probes for Semiconductor Processing

    In order to provide in situ, real time, non-invasive monitoring of the etching and deposition rates and the passivation levels of semiconductor wafers, during the processing of these materials for chip fabricatio...

    G. Gu, H. Li, J. Cook, E. A. Ogryzlo in Application of Particle and Laser Beams in… (1995)