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Article
Thickness analysis of LiF thin films by using 7Li(p,n) and 19F(p,αγ) nuclear reactions
A neutron time of flight (n-TOF) technique is applied for analyzing the thickness of a LiF thin film used as a neutron target. Measuring the flight time of the neutron generated from the neutron target gives i...
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Article
Control of the chemical state change of sulfur in solid compound targets during high-resolution PIXE measurements
A high-energy-resolution wavelength-dispersive (WD) X-ray spectrometer in the Johansson geometry, which allowed energy resolution below the natural linewidth of the Kα lines was employed in measurements of the pr...
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Article
Structural and optical characterization of GaN nanostructures formed by using N+ implantation into GaAs at various temperature
We have investigated the evolution of GaN phase nanocrystallite formation in a GaAs matrix by using nitrogen-ion implantation and subsequent rapid thermal annealing. A semi-insulating GaAs (100) wafer was impl...