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    Chapter and Conference Paper

    Reduction of Radiation Damage by Imaging with a Superconducting Lens System

    Radiation damage is enemy number one for electron microscopical investigations of organic specimens at high resolution. Many different methods have been developed to obtain more information with a resolution b...

    I. Dietrich, J. Dubochet, F. Fox, E. Knapek… in Electron Microscopy at Molecular Dimensions (1980)