11 Result(s)

Article

Microwave dielectric properties of cordierite-diopside glass-ceramics

The dependence of microwave dielectric properties on the crystallization behavior of (1-x) Mg₂Al₄Si₅O₁₈ – xCaMgSi₂O₆ glass-ceramics was investigated as a function of the CaMgSi₂O₆ content (x) and heat-treatment t...

B. K. Choi, E. S. Kim in Journal of Electroceramics (2014)

Article

Electrical and Optical Studies of the Organic Thin Film Devices Produced by Cluster Beam Deposition Methods

The neutral and ionized cluster beam deposition (NCBD and ICBD) methods have been applied to fabricate the new double-layer organic light emitting devices (OLEDs) with the structure of indium-tin-oxide (ITO)-c...

J. Y. Kim, E. S. Kim, J. H. Choi in MRS Online Proceedings Library (2011)

Article

Test Methods for Characterizing Piezoelectric Thin Films

Two experimental techniques for quantifying MEMS-relevant material constants of piezoelectric thin films are presented. The first is an improved version of our recently developed ‘plank method.’ This technique...

F. J. von Preissig, H. Zeng, E. S. Kim in MRS Online Proceedings Library (1998)

Article

Advanced Bulge Test System

The bulge test is an established method of measuring the residual stress and elastic stiffness of thin-film materials. We present an advanced experimental bulge-testing system that provides advantages in speed...

H. Keiner, F. J. von Preissig, H. Zeng, M. N. G. Nejhad… in MRS Online Proceedings Library (1997)

Article

Modelling of an electrolyte matrix for a phosphoric acid fuel cell

A simple model of an electrolyte matrix for use in a phosphoric acid fuel cell (PAFC) has been proposed. It has important features in the vertical direction. Acid absorbency, bubble pressure and current densit...

K. H. Yoon, J. H. Huh, J. H. Jang, C. S. Kim, E. S. Kim in Journal of Materials Science (1996)

Article

Thermal stability of sputter-deposited ZnO thin films

This paper describes our investigation on the thermal stability of sputterdeposited, piezoelectric, ZnO thin films, using x-ray photoelectron spectroscopy (XPS), capacitance-voltage (C-V) measurements of metal...

Y. Song, E. S. Kim, A. Kapila in Journal of Electronic Materials (1995)

Article

Characteristics of the NO dielectric film with low pressure chemical vapor deposition in-situ nitridation

We investigated the formation of the thin NO dielectric films by in-situ nitridation of native oxide, and subsequent deposition of silicon nitride in the low pressure chemical vapor deposition systems for the ...

K. H. Kim, D. H. Ko, S. H. Kang, S. T. Kim, S. J. Shim… in Journal of Electronic Materials (1994)

Article

Effect of nickel on microwave dielectric properties of Ba(Mg_1/3Ta_2/3)O₃

The dielectric and physical properties of the complex perovskite Ba(Mg_1/3Ta_2/3)O₃ system in which magnesium was substituted for nickel from 0.03–0.67 mol%, were investigated in the temperature range 20–110‡C, and...

E. S. Kim, K. H. Yoon in Journal of Materials Science (1994)

Article

Compact shrinkage during liquid-phase sintering

A. P. Savttskii, E. S. Kim, L. S. Martsunova in Soviet Powder Metallurgy and Metal Ceramics (1980)

Article

Defective structure of powders of group VI refractory metals and their mechanism of activated sintering

1. The LTAS of a defective powder takes place under conditions of primary AR and formation of an ultrafine-grain...

V. E. Panin, I. I. Kochepasov, E. S. Kim… in Soviet Powder Metallurgy and Metal Ceramics (1978)