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Reference Work Entry In depth
Thermal Stress Migration and Its Role in Electromigration of Microelectronics
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Reference Work Entry In depth
Atomic-Level Hybrid Modeling of Thermomechanical Stress Wave in Metal Thin Films Induced by Ultrashort Laser Pulses
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Reference Work Entry In depth
Functionally Graded Material Minimizes Thermoelastic Instability
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Reference Work Entry In depth
Stresses in Laser-Assisted Surface Cleaning
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Reference Work Entry In depth
Body Force Method