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Article
Epitaxial Growth and Physical Properties of La1-xCaxMnO3-δ Thin Films on MgO(001) Substrates
Perovskite La1-xCaxMnO3-δ (LCMO) thin films with a wide range of x, i.e., 0.0 ≤ x ≤ 0.6, were deposited on MgO(001) substrates using a pulsed laser deposition (PLD) technique. Epitaxial La0.7Ca0.3MnO3-δ/MgO thin ...
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Article
Microstructural Characterization of Pt/Ti and RuO2 Electrodes on SiO2/Si Annealed in the Oxygen Ambient
Microstructures and interdiffusions of Pt/Ti/SiO2/Si and RuO2/SiO2/Si during annealing in O2 were investigated using x-ray diffraction, Auger electron spectroscopy, scanning electron microscopy, and transmission ...
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Article
Rocking-Angle Ion-Milling of Cross-Sectional Samples for Transmission Electron Microscopy of Multi-Layer Systems
The cross-sectional transmission electron microscopy (TEM) specimens of Pt/Ti/SiO2/Si, RuO2/SiO2/Si, W/TiN/SiO2/Si, (Pb,La)TiO3/Pt/MgO, Bi4Ti3O12/Lal-xCaxMnO3/MgO, and GaN/Al2O3 were successfully made by the rock...
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Article
Epitaxial Sr-Bi-Ta Oxide Films of Cubic Fluorite-Like Structure
Epitaxial Sr-Bi-Ta oxide films of a cubic fluorite-like structure were grown by pulsed laser deposition. As the laser fluence increased, the lattice constant decreased. It was revealed that the Ta ion concentr...
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Article
The effect of active-layer thickness on the characteristic of nanocrystalline silicon thin film transistor
We fabricated nc-Si TFTs in order to investigate the effect of the active-layer thickness on the characteristic of the nc-Si TFT. Bottom gate nc-Si TFTs were fabricated at 350°C using ICP-CVD. The thicknesses ...
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Article
Effects of welding heat and travel speed on the impact property and microstructure of FC welds
This paper is concerned with the effects of welding heat (current x voltage = W) and travel speed (v) on the impact property and microstructure of FC (flux cored) welds. Two sets of plate were welded under dif...
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Article
Microstructural Evolution of Nickel Induced Crystallization of Amorphous Silicon
The Ni silicide-mediated phase transformation of amorphous to crystalline silicon (c-Si) was studied using transmission electron microscopy. Amorphous silicon (a-Si) films coated with very thin Ni layer (∼10-1Å) ...
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Article
Investigation of Amorphous IGZO TFT Employing Ti/Cu Source/Drain and SiNx Passivation
We successfully fabricated a-IGZO TFTs employing a Ti/Cu source/drain (S/D) and SiNx passivation in order to reduce the line-resistance, as compared to most oxide TFTs that use Mo (or TCO) and SiO2 for their S/D ...
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Article
Simultaneous Formation of Ohmic Contacts on p +- and n +-4H-SiC Using a Ti/Ni Bilayer
In this work, Ti/Ni bilayer contacts were fabricated on both p +- and n +-4H-SiC formed by ion implantation, and the effects of the Ti interlayer on the contact resistance and inte...
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Article
Spontaneous bilayer phase separations of spin-coated polymer blend thin films: A neutron reflectivity study
This study investigates the spontaneous formation of phase-separated bilayer structures of polymer blend thin films upon spin coating. Neutron reflectivity is used to measure the bilayer structure of deuterate...