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Article
Microstructural Characterization of CdTe Surface Passivation Layers
The microstructure of CdTe (CT) surface passivation layers deposited on HgCdTe (MCT) heterostructures has been evaluated using transmission electron microscopy (TEM). The MCT heterostructures were grown by liq...
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Article
Influence of 4H-SiC semi-insulating substrate purity on SiC metal-semiconductor field-effect transistor performance
The performances of silicon carbide (SiC) metal-semiconductor field-effect transistors (MESFETs) fabricated on conventional V-doped semi-insulating substrates and new V-free semi-insulating substrates have bee...
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Article
Investigation of the proton migration mechanism in the perovskite proton conductor Ba3Ca1.18Nb1.82H0.2O8.83 by means of quasielastic neutron scattering
We investigated the recently discovered high temperature proton conductor BaCa1.18Nb1.82H0.2O8.83 by means of quasielastic neutron scattering (QENS) using cold and thermal neutrons. From the former experiment we ...