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  1. No Access

    Article

    Microstructural Characterization of CdTe Surface Passivation Layers

    The microstructure of CdTe (CT) surface passivation layers deposited on HgCdTe (MCT) heterostructures has been evaluated using transmission electron microscopy (TEM). The MCT heterostructures were grown by liq...

    W.F. Zhao, J. Cook, T. Parodos, S. Tobin, David J. Smith in Journal of Electronic Materials (2010)

  2. No Access

    Article

    Influence of 4H-SiC semi-insulating substrate purity on SiC metal-semiconductor field-effect transistor performance

    The performances of silicon carbide (SiC) metal-semiconductor field-effect transistors (MESFETs) fabricated on conventional V-doped semi-insulating substrates and new V-free semi-insulating substrates have bee...

    A. P. Zhang, L. B. Rowland, E. B. Kaminsky, J. B. Tucker… in Journal of Electronic Materials (2003)

  3. No Access

    Article

    Investigation of the proton migration mechanism in the perovskite proton conductor Ba3Ca1.18Nb1.82H0.2O8.83 by means of quasielastic neutron scattering

    We investigated the recently discovered high temperature proton conductor BaCa1.18Nb1.82H0.2O8.83 by means of quasielastic neutron scattering (QENS) using cold and thermal neutrons. From the former experiment we ...

    Ch. Karmonik, R. Hempelmann, J. Cook, F. Güthoff in Ionics (1996)