Abstract
We discuss recent developments in scanning probe microscopy aiming to combine ultra-high lateral resolution with the potential of “chemical sensitivity”. Particular attention is given to techniques beyond the well-established scanning tunneling microscopy (STM) and atomic force microscopy (AFM), which allow surface imaging with atomic resolution, however, do hardly allow chemical identification of the structures under study. Starting with “nanomechanical” imaging using a modified AFM capable of local friction and elasticity measurements, we demonstrate that scanning probe microscopy can well be combined with a kind of materials recognition capability. We then turn to scanning near-field optical microscopy and spectroscopy (SNOM), a technique that combines high lateral resolution with nearly all the information accessible by optical techniques. In both cases, the present spatial resolution limits are discussed.
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G. Binning, H. Rohrer; Helv. Phys. Acta 55 (1982) 726
G. Binnig, C.F. Quate, Ch. Gerber; Phys. Rev. Lett. 56 (1986) 930
see, e.g.: R. Wiesendanger; J. Vac. Sci. Tech. B 12 (1994) 515
C.M. Mate, G. McClelland, R. Erlandsson, S. Chiang; Phys. Rev. Lett. 59 (1987) 1942
see, e.g.: O. Marti; Physica Scripta T 49 (1993) 599
P. Maivald, H.-J. Butt, S.A. Gould, C.B. Prater, B. Drake, J.A. Gurley, J.A. Ellings, P.K. Hansma; Nanotechnology 2 (1991) 103
R.M. Overnay, E. Meyer, D.J. Frommer, D. Brodbeck, R. Lüthl, L. Hohwald, H.-J. Günterodt, M. Fujihira, H. Tanako, Y. Gotoh; Nature 359 (1992) 133
see, e.g.: O. Marti, in STM and SFM in Biology, Chapter 1, Academic, New York (1993)
G. Krausch, M. Hipp, M. Böltau, O. Marti, J. Mlynek; Macromolecules 28 (1995) 260
C.D. Frisbie, L.F. Rozsnyai, A. Noy, M. Wrighton, C.M. Lieber, Science 265 (1994) 2071
E. Abbe; Arch. Mikroskop. Anat. 9 (1873) 413
E.H. Synge; Philos. Mag. 6 (1928) 356
E.A. Ash, G. Nicholls, Nature 237 (1972) 510
D.W. Pohl, W. Denk, M. Lanz; Appl. Phys. Lett. 44 (1984) 651
for a recent review, see: H. Heinzelmann, D.W. Pohl; Appl. Phys. A 59 (1994) 89
E. Betzig, J.K. Trautman, T.D. Harris, J.S. Weiner, R.L. Kostelak, Science 251 (1991) 1468
H. Bielefeldt, I. Hörsch, G. Krausch, J. Mlynek, O. Marti, Appl Phys. A 59 (1994) 103
G. Krausch, S. Wegscheider, A. Kirsch, H. Bielefeldt, J.C. Meiners, J. Mlynek; Optics Comm. 119 (1995) 283
S. Wegscheider, A. Kirsch, J. Mlynek, G. Krausch, Thin Solid Films, 264 (1995) 264
W. Straub, F. Bruder, R. Brenn, G. Krausch, H. Bielefeldt, O. Marti, J. Mlynek; Europhys. Lett. 29 (1995) 353
see, e.g.: E. Betzig, J.K. Trautmann; Science 257 (1992) 189
E. Betzig, R.J. Chichester; Science 262 (1993) 1422
J.K. Trautman, J.J. Macklin, L.E. Brus, E. Betzig; Nature 369 (1994) 40
X.S. **e, R.C. Dunn; Science 265 (1994) 361
H.F. Hess, E. Betzig, T.D. Harris, L.N. Pfeiffer, K.W. West; Science 264 (1994) 1740
E. Betzig, J.K. Trautmann, T.D. Harris, J.S. Weiner, R.S. Kostelak; Science 251 (1991) 1468
Lewis, Kopelmann, in Proc. NFO1 NATO ASI Series E242, eds. D.W. Pohl and D. Courjon (1993) 273
J.D. Pedarnig, M. Specht, M. Heckl, T.W. Hänsch; in Proc. NFO1 NATO ASI Series E242, eds. D.W. Pohl and D. Courjon (1993) 273
F. Zenhäusern, M.P. O'Boyle, H.K. Wickramsinghe; Appl. Phys. Lett. 65 (1994) 1623
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© 1996 Friedr. Vieweg & Sohn Verlagsgesellschaft mbH
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Krausch, G. (1996). Scanning probe microscopy with “chemical sensitivity”. In: Helbig, R. (eds) Advances in Solid State Physics 35. Advances in Solid State Physics, vol 35. Springer, Berlin, Heidelberg. https://doi.org/10.1007/BFb0107552
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DOI: https://doi.org/10.1007/BFb0107552
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