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The TPD Electron Probe X-Ray Micro Analyzer

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Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Summary

The article describes an electron probe X-ray micro-analyzer specially designed for mineralogical investigations and constructed for the Department of Mining Engineering of the Technological University, Delft. A miniature magnetic lens is used in the electron optics making it possible to employ a standard Leitz polarization microscope. The specimen can be rotated around the microscope axis and translated in two orthogonal directions.

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References

  1. LE Poole, J. B.: Miniature lens. Third European Regional Conference on Electron Microscopy, Prague 1964, p. 439.

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  2. DuxcuMS, P., and P. K. Shields • Calculation of fluorescence. Third Internat. Symposium, Stanford, A.P. 1963, p. 329–340.

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  3. Bishop, H. E.: The absorption and atomic number corrections. Brit. J. Appl. Phys., Ser. II, 1, 673–684 (1968).

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  4. Springer, G.: Investigations into the atomic number effect. Neues Jahrb. Mineral. Monatsh. 1967, 304–317.

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Author information

Authors and Affiliations

  1. Institute of Applied Physics TNO-TH, Delft, Netherlands

    L. A. Fontijn, A. B. Bok & J. G. Kornet

Authors
  1. L. A. Fontijn
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  2. A. B. Bok
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  3. J. G. Kornet
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Editor information

Editors and Affiliations

  1. Institut für angewandte Physik der Universität, 74, Tübingen, Germany

    G. Möllenstedt  & K. H. Gaukler  & 

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© 1969 Springer-Verlag Berlin Heidelberg

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Fontijn, L.A., Bok, A.B., Kornet, J.G. (1969). The TPD Electron Probe X-Ray Micro Analyzer. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-24778-5_40

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  • DOI: https://doi.org/10.1007/978-3-662-24778-5_40

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-22845-6

  • Online ISBN: 978-3-662-24778-5

  • eBook Packages: Springer Book Archive

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