A Study by Low Energy SIMS of Chromium Behavior in an Oxide Film of Low-Chromium Steel

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Secondary Ion Mass Spectrometry SIMS IV

Part of the book series: Springer Series in Chemical Physics ((CHEMICAL,volume 36))

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Abstract

Chromium has an important role for passivation of metal surfaces. Many researchers have studied the composition and structure of oxide film on the surface of various kinds of iron-chromium alloys by means of XPS [1], AES [2, 3], ISS [4] and SIMS [5]. These surface analyzing methods afford to give information on the topmost surfaces. Tjong et al. [3] have studied the alloys (Cr; 3, 9, 12 and 18%) and found the bulk compositions of these alloys may bring significant changes of growth rate of oxide on them. Buczek et al. [2] also reported that the thickness of oxide was reduced as chromium content in an alloy increased.

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© 1984 Springer-Verlag Berlin Heidelberg

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Yamaguchi, S., Kikuchi, T., Furuya, K. (1984). A Study by Low Energy SIMS of Chromium Behavior in an Oxide Film of Low-Chromium Steel. In: Benninghoven, A., Okano, J., Shimizu, R., Werner, H.W. (eds) Secondary Ion Mass Spectrometry SIMS IV. Springer Series in Chemical Physics, vol 36. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-82256-8_115

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  • DOI: https://doi.org/10.1007/978-3-642-82256-8_115

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-82258-2

  • Online ISBN: 978-3-642-82256-8

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