Introduction
Both amplitude and phase of an optical wavefront are necessary in many applications. However, the conventional detector can only measure the intensity of the wavefront. The phase should be measured by interferometry [1] or phase retrieval techniques [2, 3]. Compared to the interferometry, the phase retrieval methods just need diffracted intensity images without a reference beam, which makes the experimental setup simple. There are mainly two kinds of phase retrieval techniques. One is quantization phase retrieval which is based on the transport of intensity equation [2]. The other one is based on the iterative algorithm [3-5].
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
Similar content being viewed by others
References
Gabor, D.: A new microscopic principle. Nature 161, 777–778 (1948)
Teague, M.: Irradiance moments: their propagation and use for unique retrieval of phase. J. Opt. Soc. Am. 72, 1199–1209 (1982)
Pedrini, G., Osten, W., Zhang, Y.: Wave-front reconstruction from a sequence of interferograms recorded at different planes. Opt. Lett. 30, 833–835 (2005)
Bao, P., Zhang, F., Pedrini, G., Osten, W.: Phase retrieval using multiple illumination wavelengths. Opt. Lett. 33, 309–311 (2008)
Bao, P., Situ, G., Pedrini, G., Osten, W.: Lensless phase microscopy using phase retrieval with multiple illumination wavelengths. Appl. Opt. 51, 5486–5494 (2012)
Goodman, J.W.: Introduction to Fourier Optics, 3rd edn. (2005)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer-Verlag Berlin Heidelberg
About this paper
Cite this paper
Chen, N., Yeom, J., Lee, B. (2014). Optimized Phase Retrieval Algorithm with Multiple Illuminations. In: Osten, W. (eds) Fringe 2013. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-36359-7_60
Download citation
DOI: https://doi.org/10.1007/978-3-642-36359-7_60
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-36358-0
Online ISBN: 978-3-642-36359-7
eBook Packages: EngineeringEngineering (R0)