Quantitative X-ray diffractometry use of internal standard

  • Chapter
Worked Examples in X-Ray Analysis
  • 158 Accesses

Abstract

The weight fraction of α quartz (SiO2) has to be determined in a natural specimen. To correct for the unknown absorption in this specimen, 200mg KC1 are added to 1000 mg of the sample, both very finely, ground, and well mixed.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Subscribe and save

Springer+ Basic
EUR 32.99 /Month
  • Get 10 units per month
  • Download Article/Chapter or Ebook
  • 1 Unit = 1 Article or 1 Chapter
  • Cancel anytime
Subscribe now

Buy Now

eBook
EUR 9.99
Price includes VAT (Germany)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
EUR 90.94
Price includes VAT (Germany)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free ship** worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Authors

Rights and permissions

Reprints and permissions

Copyright information

© 1970 Springer Science+Business Media New York

About this chapter

Cite this chapter

Jenkins, R., de Vries, J.L. (1970). Quantitative X-ray diffractometry use of internal standard. In: Worked Examples in X-Ray Analysis. Springer, New York, NY. https://doi.org/10.1007/978-1-4899-2647-0_36

Download citation

  • DOI: https://doi.org/10.1007/978-1-4899-2647-0_36

  • Publisher Name: Springer, New York, NY

  • Print ISBN: 978-1-4899-2649-4

  • Online ISBN: 978-1-4899-2647-0

  • eBook Packages: Springer Book Archive

Publish with us

Policies and ethics

Navigation