Abstract
Adiffractogram of quartz exhibited an additional spurious peak at approximately 6° (2θ).The effect was observed both in specimens containing only low atomic number elements and specimens containing high atomic number elements. The patterns were always taken using Cu radiation, proportional counter (Xe-filled) and pulse height selection. The pulse height selector was set at the 45% acceptance level since the resolution of the counter (peak width at half height) was 18% for Cu Kα radiation.
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© 1970 Springer Science+Business Media New York
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Jenkins, R., de Vries, J.L. (1970). Spurious peaks in X-ray diffractograms. In: Worked Examples in X-Ray Analysis. Springer, New York, NY. https://doi.org/10.1007/978-1-4899-2647-0_15
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DOI: https://doi.org/10.1007/978-1-4899-2647-0_15
Publisher Name: Springer, New York, NY
Print ISBN: 978-1-4899-2649-4
Online ISBN: 978-1-4899-2647-0
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